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Void evolution and its dependence on segment length in Cu interconnects
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- Journal:
- Journal of Materials Research / Volume 19 / Issue 11 / November 2004
- Published online by Cambridge University Press:
- 01 November 2004, pp. 3135-3138
- Print publication:
- November 2004
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Bonding in Ion-Implanted Diamond-Like Carbon Films Characterized by TEM Spectrum Lines and Energy-Filtered Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 154-155
- Print publication:
- August 2000
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Bonding in Ion-Implanted Carbon Films Characterized by TEM Spectrum Lines and Energy-Filtered Imaging
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- Journal:
- MRS Online Proceedings Library Archive / Volume 589 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 395
- Print publication:
- 1999
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