5 results
Visualization of Anitimony (Sb) Dopant Clusters in Silicon Specimen by Large Angle Convergent Beam HAADF-STEM
-
- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1732-1733
- Print publication:
- July 2010
-
- Article
-
- You have access
- Export citation
Detection of Arsenic Dopant Atoms in Silicon Crystal by Aberration Corrected Scanning Transmission Electron Microscope
-
- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1488-1489
- Print publication:
- July 2009
-
- Article
-
- You have access
- Export citation
FIB Micro-Pillar Sampling Technique For 3D Stem Observation And Its Application
-
- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 06 August 2003, pp. 118-119
- Print publication:
- August 2003
-
- Article
-
- You have access
- Export citation
A Newly Developed Fib System For Tem Specimen Preparation
-
- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 November 2002, pp. 48-49
- Print publication:
- August 2002
-
- Article
-
- You have access
- Export citation
Three Dimensional Characterization of a Specific Site by an FIB Micro-Sampling Technique
-
- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 938-939
- Print publication:
- August 2001
-
- Article
- Export citation