23 results
Reducing the Missing Wedge in TEM Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 26-27
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- July 2016
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Towards Quantitative 3D Chemical Analysis in TEM Using Quadrant XEDS Detector Geometry
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 762-763
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- August 2014
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The Effect of Probe Correctors on the Analytical Results of Non-ideal Samples
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 566-567
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- August 2014
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Progress with the Sandia Titan G2 80-200 with 0.7sr Integral SDD Array
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 324-325
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- July 2012
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Structural and Compositional Transitions at the Atomic Scale Across Interfaces, Faults and Phase Separations in Complex Oxides
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 1404-1405
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- July 2010
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Geometric Limits on Spatial Resolution for Cs Corrected STEM Analysis of Thick TEM Lamellae
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 150-151
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- July 2010
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Factors Affecting Elemental Quantification at the atomic Scale Using EELS
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 448-449
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- July 2009
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The Use of Transmission Electron Microscopy – What are the Real Capabilities and When can I use it?
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 1542-1543
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- July 2009
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Processing and microstructure characterization of a novel porous hierarchical TiO2 structure
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- Journal of Materials Research / Volume 24 / Issue 5 / May 2009
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- 31 January 2011, pp. 1683-1687
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- May 2009
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A Novel Automated Method to Measure Strain at the Nano Scale
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 834-835
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- August 2007
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Evidence for a Critical Amorphization Thickness Limit of Ga+ Ion Bombardment in Si
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 1516-1517
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- August 2007
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Practical Electron Microscopy with Correctors and Monochromators
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 860-861
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- August 2007
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Atomic Resolution Cs-Corrected HR-S/TEM from 80-300kV
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1162-1163
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- August 2007
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Preliminary Results from a Sub-Angstrom TEM
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 1478-1479
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- August 2006
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Design Advances and New Results of a Sub-Ångström Dedicated Corrector S/TEM
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 1370-1371
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- August 2006
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Nano-analysis of the Metallic Multilayers Using High Resolution Microscopy
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 716-717
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- August 2006
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The Design and First Results of a Dedicated Corrector (S)TEM.
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
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- 01 August 2005, pp. 2148-2149
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- August 2005
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2 keV Ga+ FIB Milling for Reducing Amorphous Damage in Silicon
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 828-829
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- August 2005
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Design of an Analytical TEM/STEM with 0.3 srad EDX Detection
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 704-705
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- August 2005
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Comparison of Different Sample Preparation Techniques in TEM Observation of Microstructure of INCONEL alloy 783 Subjected to Prolonged Isothermal Exposure
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 24 July 2003, pp. 798-799
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- August 2003
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