4 results
On the Mechanism of Intrinsic Gettering by Butterfly-Type Defects in Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 71 / 1986
- Published online by Cambridge University Press:
- 28 February 2011, 21
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- 1986
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EBIC Spectroscopy - A New Approach to Microscale Characterization of Deep Levels in Semi-Insulating GaAs
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- Journal:
- MRS Online Proceedings Library Archive / Volume 46 / 1985
- Published online by Cambridge University Press:
- 28 February 2011, 441
- Print publication:
- 1985
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High Resolution Optical Study of The Antisite Defect ASGa in GaAs; Correlation with Midgap Level EL2
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- Journal:
- MRS Online Proceedings Library Archive / Volume 46 / 1985
- Published online by Cambridge University Press:
- 28 February 2011, 207
- Print publication:
- 1985
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Scattering of Free Carriers by Oxide Precipitates in Czochralski-Grown Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 46 / 1985
- Published online by Cambridge University Press:
- 28 February 2011, 291
- Print publication:
- 1985
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