8 results
Electromigration-induced strain relaxation in Cu conductor lines
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- Journal:
- Journal of Materials Research / Volume 26 / Issue 4 / 28 February 2011
- Published online by Cambridge University Press:
- 11 February 2011, pp. 498-502
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- 28 February 2011
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Changes in stress levels and the immuno-modulatory effects of Echinaforce®
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- Journal:
- Proceedings of the Nutrition Society / Volume 68 / Issue OCE2 / 2009
- Published online by Cambridge University Press:
- 27 October 2009, E96
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Designing a nutrition-based intervention using a novel cooperative learning model
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- Journal:
- Proceedings of the Nutrition Society / Volume 68 / Issue OCE2 / 2009
- Published online by Cambridge University Press:
- 27 October 2009, E99
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Thermal and Electromigration-Induced Strains in Copper Conductor Lines: X-ray Microbeam Measurements and Analysis
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- Journal:
- MRS Online Proceedings Library Archive / Volume 914 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0914-F06-06
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- 2006
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Concentration and Stress Evolution During Electromigration in Passivated Al(0.25 at. % Cu) Conductor Lines
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- MRS Online Proceedings Library Archive / Volume 612 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, D1.8.1
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- 2000
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Effects of Y and Zr Dopants on Grain Boundary Structure in Creep Resistant Polycrystalline Alumina
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- MRS Online Proceedings Library Archive / Volume 654 / 2000
- Published online by Cambridge University Press:
- 21 March 2011, AA1.1.1
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- 2000
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X-Ray Microbeam Studies of Electromigration
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- Journal:
- MRS Online Proceedings Library Archive / Volume 563 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 153
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- 1999
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In-Situ X-Ray Microbeam Cu Fluorescence and Strain Measurements on Al(0.5 AT.% Cu) Conductor Lines During Electromigration
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- Journal:
- MRS Online Proceedings Library Archive / Volume 563 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 163
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- 1999
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