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Abilities Towards Improved Accuracy in EPMA
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1108-1110
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- August 2021
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The Detector Efficiency Question with EDS
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1674-1676
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- August 2021
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EDS Quantification Using Fe L Peaks and Low Beam Energy
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1670-1672
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- August 2021
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The Detectors Response of an EDS Spectrometer in Low Energy Spectrum Part
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1552-1553
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- August 2020
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Bremsstrahlung Background Modeling Without Fit Regions
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2178-2180
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- August 2020
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Effect of the Silicon Drift Detector on EDAX Standardless Quant Methods
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- Journal:
- Microscopy Today / Volume 28 / Issue 2 / March 2020
- Published online by Cambridge University Press:
- 17 March 2020, pp. 34-39
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- March 2020
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A New Methodology for Element Imaging in the Scanning Electron Microscope
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
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- 02 July 2020, pp. 1054-1055
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- August 2001
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New Technologies for Microanalysis and Element Imaging in THJ Scanning Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 884-885
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- August 2001
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