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Exploring the Parameter Space of Point Spread Function Determination for the Scanning Electron Microscope—Part II: Effect on Image Restoration Quality
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- Microscopy and Microanalysis / Volume 25 / Issue 5 / October 2019
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- 30 August 2019, pp. 1183-1194
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- October 2019
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Exploring the Parameter Space of Point Spread Function Determination for the Scanning Electron Microscope—Part I: Effect on the Point Spread Function
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- Microscopy and Microanalysis / Volume 25 / Issue 5 / October 2019
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- 27 August 2019, pp. 1167-1182
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- October 2019
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The Determination and Application of the Point Spread Function in the Scanning Electron Microscope
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- Microscopy and Microanalysis / Volume 24 / Issue 4 / August 2018
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- 03 September 2018, pp. 396-405
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- August 2018
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Visualizing Astigmatism in the SEM Electron Probe
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
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- 01 August 2018, pp. 604-605
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- August 2018
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Some Thoughts on Point Spread Functions, Resolution and Image Quality
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
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- 01 August 2018, pp. 600-601
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- August 2018
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Scanning Electron Microscope Point Spread Function Determination Through the Use of Particle Dispersions
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 124-125
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- July 2017
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Viability of Point Spread Function Deconvolution for SEM
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 126-127
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- July 2017
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A Software Approach to Improving SEM Resolution, Image Quality, and Productivity
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- Microscopy Today / Volume 25 / Issue 3 / May 2017
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- 03 May 2017, pp. 18-25
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- May 2017
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An Evaluation of Image Quality Metrics for Scanning Electron Microscopy
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 572-573
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- July 2016
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Improved Low Voltage SEM Image Resolution Through the Use of Image Restoration Techniques
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 33-34
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- August 2015
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Measurement of the Electron Beam Point Spread Function (PSF) in a Scanning Electron Microscope (SEM)
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 699-700
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- August 2015
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Improved SEM Image Resolution Through the Use of Image Restoration Techniques
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 12-13
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- August 2014
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The Use of Regularized Least Squares Minimization for the Deconvolution of SEM Images
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 386-387
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- August 2014
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Improving Scanning Electron Microscope Resolution for Near Planar Samples Through the Use of Image Restoration
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- Microscopy and Microanalysis / Volume 20 / Issue 1 / February 2014
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- 14 October 2013, pp. 78-89
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- February 2014
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Development of a New Quantitative X-Ray Microanalysis Method for Electron Microscopy
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- Microscopy and Microanalysis / Volume 16 / Issue 6 / December 2010
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- 20 October 2010, pp. 821-830
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- December 2010
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Win X-ray: A New Monte Carlo Program that Computes X-ray Spectra Obtained with a Scanning Electron Microscope
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- Microscopy and Microanalysis / Volume 12 / Issue 1 / February 2006
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- 09 December 2005, pp. 49-64
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- February 2006
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Considerations for Three Dimensional Imaging In the Crossbeam FIB
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
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- 01 August 2004, pp. 1134-1135
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- August 2004
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Theoretical Effect of Thin Films on the Detectability of Elements in the Substrate by X-Ray Microanalysis
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
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- 01 August 2004, pp. 100-101
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- August 2004
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Precision and Detection Limits for EDS Analysis in the SEM
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- Microscopy Today / Volume 11 / Issue 5 / August 2003
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- 14 March 2018, pp. 46-49
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- August 2003
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Win X-ray, The Monte Carlo Program for X-ray Microanalysis in the Scanning Electron Microscope
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
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- 06 August 2003, pp. 32-33
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- August 2003
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