8 results
Electron and X-ray Tomography of Iron/Iron Oxide Redox Reactions for Large-Scale Hydrogen Storage
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 578-579
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- August 2013
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Characterization of Small Cu Grains Using the Conical Dark-Field Technique in the Transmission Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 09 April 2017, pp. 1100-1101
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- July 2011
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Efficient Target Preparation by Combined Pulsed Laser Ablation and FIB Milling
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 658-659
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- July 2011
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Investigation of Boron Delta-layers in Silicon Measured by Atom Probe Tomography (APT)
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 282-283
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- July 2009
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In-situ Low Energy Argon Ion Milling of Nanoelectronic Structures Using a Triple Beam System
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 170-171
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- July 2009
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Determination of dielectric permittivity from EELSpectra in semiconductor structures
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1252-1253
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- August 2007
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Measurement of k-value in Semiconductor Structures
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1176-1177
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- August 2006
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TEM Sample Preparation Using Focused Ion Beam - Capabilities And Limits
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- Journal:
- Microscopy Today / Volume 11 / Issue 2 / April 2003
- Published online by Cambridge University Press:
- 14 March 2018, pp. 22-25
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- April 2003
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