7 results
Atom probe tomography of nanoscale electronic materials
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- Journal:
- MRS Bulletin / Volume 41 / Issue 1 / January 2016
- Published online by Cambridge University Press:
- 08 January 2016, pp. 30-34
- Print publication:
- January 2016
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Experimental Evaluation of Conditions Affecting Specimen Survivability in Atom Probe Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 849-850
- Print publication:
- August 2015
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Atom Probe Characterization of Corroded Alloy 600
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1020-1021
- Print publication:
- August 2013
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Real time synchrotron analysis of the initial stages of the galvanization process in Al containing Zn baths
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- Journal:
- Revue de Métallurgie – International Journal of Metallurgy / Volume 102 / Issue 1 / January 2005
- Published online by Cambridge University Press:
- 02 February 2005, pp. 75-78
- Print publication:
- January 2005
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Characterization of Ni- and Ni(Pt)-Silicide Formation on Narrow Polycrystalline Si Lines by Raman Spectroscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 591 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 269
- Print publication:
- 1999
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Formation and Stability of NI(PT) Silicide on (100)SI and (111)SI
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- Journal:
- MRS Online Proceedings Library Archive / Volume 564 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 163
- Print publication:
- 1999
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Formation and Relaxation of Ni(Au) Disilicide
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- Journal:
- MRS Online Proceedings Library Archive / Volume 402 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 65
- Print publication:
- 1995
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