5 results
Electron Image Series Reconstruction of Twin Interfaces in InP Superlattice Nanowires
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue 5 / October 2011
- Published online by Cambridge University Press:
- 08 September 2011, pp. 752-758
- Print publication:
- October 2011
-
- Article
- Export citation
High-Resolution TEM and the Application of Direct and Indirect Aberration Correction
-
- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue 1 / February 2008
- Published online by Cambridge University Press:
- 03 January 2008, pp. 60-67
- Print publication:
- February 2008
-
- Article
- Export citation
Sub-Ångstrom Resolution with a Mid-Voltage TEM
-
- Journal:
- Microscopy Today / Volume 12 / Issue 3 / May 2004
- Published online by Cambridge University Press:
- 14 March 2018, pp. 28-29
- Print publication:
- May 2004
-
- Article
-
- You have access
- Export citation
Laboratory Design for High-Performance Electron Microscopy
-
- Journal:
- Microscopy Today / Volume 12 / Issue 3 / May 2004
- Published online by Cambridge University Press:
- 14 March 2018, pp. 8-17
- Print publication:
- May 2004
-
- Article
-
- You have access
- Export citation
Simulated Image Maps for Use in Experimental High-Resolution Electron Microscopy
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 159 / 1989
- Published online by Cambridge University Press:
- 25 February 2011, 453
- Print publication:
- 1989
-
- Article
- Export citation