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Ion-Irradiated Damage in Semiconductors Visualized by Means of Low-kV Scanning Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 486-487
- Print publication:
- August 2019
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High resistivity isolation for AlGaN/GaN HEMT using Al double-implantation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1635 / 2014
- Published online by Cambridge University Press:
- 17 February 2014, pp. 9-14
- Print publication:
- 2014
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ZnO-based p-n Junctions with p-type ZnO by ZnTe Oxidation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 891 / 2005
- Published online by Cambridge University Press:
- 01 February 2011, 0891-EE08-11
- Print publication:
- 2005
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Microstructure and Thermal Stability of Transition Metal Nitrides and Borides on GaN
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- Journal:
- MRS Online Proceedings Library Archive / Volume 622 / 2000
- Published online by Cambridge University Press:
- 15 March 2011, T6.34.1
- Print publication:
- 2000
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Au-GaAs Reaction Kinetics: Its Role in Fabrication of Ohmic Contacts
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- Journal:
- MRS Online Proceedings Library Archive / Volume 260 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 317
- Print publication:
- 1992
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