22 results
Growth andIn SituCharacterization of Oxide Epitaxial Heterostructures with Atomic Plane Precision
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1504-1505
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- July 2016
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Atomic-Level Fabrication of Crystalline Oxides in STEM
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 939-940
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- August 2015
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Determination of Local Chemistry Composition of Low-Dimensional Semiconductor Nanostructures Through the use of High-Resolution HAADF images
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2083-2084
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- August 2015
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Performance and Stability of Dedicated Aberration-Corrected STEMs: a User's Perspective
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 924-925
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- August 2014
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Interface Magnetism in LaMnO3 / SrTiO3 Superlattices: Influence of Oxygen Octahedral Tilts
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1916-1917
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- August 2013
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Electrical Activity of Defects in CdTe Solar Cells via Aberration-corrected STEM
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 334-335
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- August 2013
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Atomic Structure of Surface Dielectric Dead Layer in BiFeO3 Thin Film
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1928-1929
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- August 2013
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Low Voltage STEM for the Study of Defects in 2D Materials
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1232-1233
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- August 2013
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AB/AC Stacking Boundaries in Bilayer Graphene
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1942-1943
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- August 2013
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High-Resolution STEM Analysis of Nanoparticle Materials
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1438-1439
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- August 2013
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Interplay of Octahedral Rotations, Magnetic and Electronic Properties in Epitaxial LaCoO3 Thin Films
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1924-1925
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- August 2013
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Quantifying oxygen vacancies in fuel-cells materials using atomic EELS analysis
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1128-1129
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- August 2013
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Insights Into Energy Materials Through Aberration-Corrected STEM
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1354-1355
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- July 2012
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Single Atom Microscopy
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 342-343
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- July 2012
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Initial Results from a 200 kV UltraSTEM
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 326-327
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- July 2012
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Study of Selected Grain Boundaries in CdTe by Aberration-corrected STEM
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 424-425
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- July 2012
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Characterizing the Two- and Three-Dimensional Resolution of an Improved Aberration-Corrected STEM
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- Microscopy and Microanalysis / Volume 15 / Issue 5 / October 2009
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- 16 September 2009, pp. 441-453
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- October 2009
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Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit
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- Microscopy and Microanalysis / Volume 14 / Issue 5 / October 2008
- Published online by Cambridge University Press:
- 16 September 2008, pp. 469-477
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- October 2008
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Nanoscale Analysis of Complex Oxide Interfaces
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 24 July 2003, pp. 822-823
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- August 2003
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Aberration-Corrected STEM: the Present and the Future
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 896-897
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- August 2001
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