5 results
Self Organized InAs Quantum Dots on Patterned GaAs Substrates
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- Journal:
- MRS Online Proceedings Library Archive / Volume 872 / 2005
- Published online by Cambridge University Press:
- 01 February 2011, J19.4
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- 2005
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Simulation of Focused Ion Beam Induced Damage Formation in Crystalline Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 792 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, R10.10
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- 2003
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FIB-TEM Characterization of Locally Restricted Implantation Damage
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- Journal:
- MRS Online Proceedings Library Archive / Volume 738 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, G7.14
- Print publication:
- 2002
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Effects of Ga-Irradiation On Properties of Materials Processed by A Focused Ion Beam (FIB)
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- Journal:
- MRS Online Proceedings Library Archive / Volume 647 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, O6.6
- Print publication:
- 2000
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Ion Beam Induced Chemical Vapor Deposition of Dielectric Materials
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- Journal:
- MRS Online Proceedings Library Archive / Volume 624 / 2000
- Published online by Cambridge University Press:
- 10 February 2011, 163
- Print publication:
- 2000
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