This paper outlines some features of diffraction instrumental monitoring (DIM), a method which can prove helpful to evaluate systematic effects from diffraction measurements and facilitate the comparison of results. The work provides some consideration of the significance of the information contained in diffraction patterns and the ability of DIM methods to yield the effective values of instrumental parameters obtained under working conditions.

The structure of the Ba5R8Zn4O21 series (R=lanthanides) was investigated using X-ray Rietveld refinements. The compounds were successfully prepared for R=Eu, Gd, Dy, Ho, Er, Tm, and Yb. Ba5R8Zn4O21 crystallizes in the tetragonal space group I4/m; for R=Yb to Eu, a ranges from 13.635 02(5) to 13.960 62(9) Å, c from 5.658 46(3) to 5.784 83(5) Å, and V from 1051.987(8) to 1127.459(14) Å3. The Zn2+ ions adopt a fivefold distorted square pyramidal coordination. The seven-coordinate R3+ reside in monocapped trigonal prisms. These prisms share edges, and form layers stacked along the c axis. There are two types of BaO polyhedra: bicapped square prisms (BaO10), and irregular BaO10 polyhedra. For larger R, Ba5R8Zn4O21 was not stable, and tetragonal BaR2ZnO5(La, Nd) and orthorhombic BaR2ZnO5(Sm) phases were observed instead.

The outcome of the analysis of data from a Round Robin on a KCl sample is reported. The research project has led to a definition of a working protocol for the treatment of X-ray diffraction data from powders (XRPD). The protocol is based on the method of “Diffraction Instrumental Monitoring” (DIM), whose main characteristics are briefly illustrated. When experimental data are referred to the expected standard values of the lattice parameter, the method enables comparison with data obtained from differing instrumentation found in different laboratories. Application of DIM to the KCl Round Robin demonstrates the ability of DIM to effectively evaluate systematic contribution. Accuracy on the cell parameter is obtained as a direct consequence; in this application, where the knowledge of the KCl d-spacing was not a problem, the accuracy of lattice parameter is a feedback for constraining the evaluation of the effective values of the experiment-related parameters.

A lattice metric singularity occurs when unit cells defining two (or more) lattices yield the identical set of unique calculated d-spacings. The existence of such singularities, therefore, has a practical impact on the indexing of powder patterns. Lattice metric singularities often involve lattices that are in a derivative relationship one to another. A variety of types of singularities are possible depending on the number of different lattices involved (i.e., binary, ternary, quaternary), on the nature of the derivative lattice relationship (i.e., subcell/supercell, composite), on the Bravais type of each of the lattices, and on the the volume ratio(s) of primitive cells defining the lattices. In the laboratory, an encounter with a singularity can lead one into a trap; viz., the investigator using an indexing program, or by other means, may determine only one of the lattices with a high figure of merit. When this happens, it is critical to recognize that there exists more than one indexing solution. In a previous work, a binary singularity was described involving a monoclinic and a rhombohedral lattice. In the present work, we describe a second type of singularity—a ternary singularity—in which the two of the three lattices are in a derivative composite relationship.

The Monte Carlo method is applied to finding missing atoms in solving inorganic crystal structures without applying a rigid-body approximation. Whole powder patterns of α-SiO2 and Mg2SiO4 were used for testing a procedure. Four atoms among the six in the asymmetric unit of Mg2SiO4 could be found in the present analysis. The use of well-refined profile parameters enhanced the frequency of correct structure configurations in the Monte Carlo search. Utilizing structural information available for constructing a trial configuration is also considered to be important for efficiently searching the structure solution. A procedure for assignment of equivalent positions to respective atoms is presented. The method can be used as a powerful tool for finding missing atoms in a partially solved structure. A histogram of weighted reliability index in Monte Carlo calculations is very informative for evaluating the performance of the method. ©

The characteristics of the (101) peak of α-quartz and the (104) peak of the NIST SRM 1976 alumina flat plate standard have been measured in dependence of time for 60 h with Cu-Kα1 radiation in Bragg-Brentano geometry with a Philips X’Pert diffractometer equipped with a primary Ge(111) monochromator. It was found that the reproducibility of the peak position and the peak shape falls well in the ±3σ range, whereas the peak intensity strongly depends on the power history of the X-ray generator and the temperature of the diffraction system. The effects on Rietveld refinements are discussed and recommendations are given for optimized data collection.

Polycrystalline lead iodide, PbI2, was recrystallized from hot water to reproducibly obtain flat plate-like crystals, which manifested extreme preferred orientation greatly favoring the 001, 002, 003, and 004 planes. Polycrystalline samples of PbI2 were intercalated with tripropylamine, simultaneously producing a “new” intercalate 001 peak at 7.791°2θ (d=1.1347 nm) and diminishing the host PbI2 001 peak at 12.67°2θ (d=0.6980 nm). This is consistent with large increases in the c direction of the unit cell associated with inserting a guest between adjacent iodide layers of the host PbI2. Experimental powder diffraction results are compared to theoretical values calculated using CRYSTALMAKER and CRYSTALDIFFRACT software

The aim of this work was to design, construct, install, and commission an on-line, X-ray diffraction (XRD) analyzer capable of continuously monitoring phase abundances for use in process plant control. This has been achieved through a joint project between CSIRO Minerals and Fuel & Combustion Technology Pty. Ltd. with an instrument designed for use in a Portland cement manufacturing plant. Key factors in tailoring such an instrument to the cement industry were (i) the handling and presentation of a dry sample and (ii) the development of an analytical method suitable for the complex suite of phases contained within Portland cement. The instrument incorporates continuous flow of sample through the diffractometer using a purpose-built sample presentation stage. The XRD data are collected simultaneously using a wide range (120° 2θ) position sensitive detector, thus enabling rapid collection of the full diffraction pattern. The data are then analyzed using a Rietveld analysis method to obtain a quantitative estimate of each of the phases present. The instrument is controlled by a PC linked to the diffractometer through a purpose built interface. The phase abundance information is then transmitted to the central computer in the cement plant where it can be used for the control of mill parameters such as temperature and retention times as well as gypsum feed rate.

Modern powder diffraction employing computer-controlled diffractometers now allows quantitative analytical methods to use the whole diffraction trace rather than only individual peaks. Two such methods are in common use: the Rietveld method, which refines the crystal structures of the component phases as part of the matching calculation, and the pattern-fitting method, which uses reference patterns from a database. Potential accuracies of these methods seems to be around 1% absolute. The most severe limitation on the potential accuracy of these methods is particle statistics, which has been reviewed in considerable detail.

In this work, zinc oxide samples were obtained from hydroxycarbonate by thermal decomposition at 300 °C. Zinc hydroxycarbonate samples were produced by homogeneous precipitation over different periods of time. The method used to obtain zinc oxide produces different morphologies as a function of the precursor precipitation time. Among the obtained particle shapes were porous spherical aggregates, spherulitic needle aggregates, and single acicular particles. This work investigated spherulitic needle-aggregate formation and the correlation among morphology, domain size, and microstrain. Transmission electron microscopy data revealed that the acicular particles that form the spherulitic needle aggregates consist of nanometer crystallites. Apparent crystallite size and microstrain in the directions perpendicular to (h00), (h0l), (hk0), and (00l) planes were invariable as a function of precursor precipitation time. From the results, it was possible to conclude that the precursor precipitation period directly influenced the morphology of the zinc oxide but did not influence average crystallite size and microstrain for ZnO samples. Therefore, using this route, it was possible to prepare zinc oxide with different morphologies without microstructural alterations.

The object was to perform simultaneous quantitative analyses of complex pharmaceutical solid mixtures by the Rietveld method. Mixtures consisting of anhydrous β-carbamazepine, anhydrous α-carbamazepine, and carbamazepine dihydrate were chosen as the model system. Lithium fluoride was used as the internal standard. Mixtures of various compositions were prepared and subjected to X-ray powder diffractometry (XRD). The XRD pattern of each mixture was analyzed by the Rietveld method and at the end of the refinement, the goodness of fit was evaluated. When the analyte concentration was high (≥20%), the relative error in the determination was <±5%. The detection of analyte was possible even when its concentration was low (<1% w/w). A unique advantage of the method is that it enables simultaneous quantitative analyses of multiple phases without the requirement of “standard curves.” © 2001 International Centre for Diffraction Data.

A new zinc phosphate was synthesized by the hydrothermal reaction of zinc oxide and phosphoric acid in the presence of 1,4-diaminebutane. The formula of the product is (ZnPO4)4(H3PO4)2(C4N2H14)2 and crystallizes in the triclinic system with a=8.6590(3) Å, b=10.3467(3) Å, c=8.3910(3) Å, α=102.180(2)°, β=93.676(2)°, and γ=88.203(2)°.

Single-crystal synchrotron X-ray diffraction (XRD) data were collected and refined for congruent lithium niobate crystals 8 and 6 μm in diameter, sizes that are comparable to the size of the powder particles used in powder diffraction. The motivation for using such small crystals is to minimize problems such as extinction, which decrease with crystal size. The R/wR factors were 0.011/0.014 and 0.019/0.018, for the 8 and 6 μm data, respectively, and the goodness of fit factors were 2.3(1) and 1.63(8), which compare favorably with values obtained from previous powder and single-crystal diffraction studies. Results from single-crystal XRD using crystals less than 10 μm in size may rival those obtained from powder diffraction.

X-ray powder diffraction is one of the two principal methods used for the routine analysis of free SiO2 for monitoring silica in the industrial workplace. During late 1996 and early 1997, a questionnaire was prepared and distributed to all the analytical laboratories on the American Industrial Hygiene Association (AIHA) list of accredited facilities that indicated they did analyses for silica. This report is based on the responses to that questionnaire with comments from the author on the responses and recommendations that suggest themselves from the responses.

Using a recent proposed analysis procedure for quantitative phase determination by X-ray powder diffraction, YBa2Cu3O7−x solid state formation reaction kinetics at 900 °C was studied. Although there was the presence of partial amorphous components, it was possible to determine a reaction route for the synthesis of the title compound from X-ray powder diffraction data collected at various stages of the thermal treatment and using the Rietveld method for the quantitative determination of the phase composition