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Review of questionnaire to AIHA accredited laboratories for the analysis of silica

  • Deane K. Smith (a1)

Abstract

X-ray powder diffraction is one of the two principal methods used for the routine analysis of free SiO2 for monitoring silica in the industrial workplace. During late 1996 and early 1997, a questionnaire was prepared and distributed to all the analytical laboratories on the American Industrial Hygiene Association (AIHA) list of accredited facilities that indicated they did analyses for silica. This report is based on the responses to that questionnaire with comments from the author on the responses and recommendations that suggest themselves from the responses.

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Buhrke, V. E., Jenkins, R., and Smith, D. K. (1995). Specimen Preparation for X-Ray Fluorescence and X-ray Diffraction Analysis (Wiley-VCH, New York).
Elton, N. J., and Salt, P. D. (1996). “Particle statistics in quantitative X-ray diffractometry,” Powder Diffr. PODIE2 11, 219229. pdj, PODIE2
Smith, D. K. (1993). “Particle statistics and whole pattern methods in quantitative x-ray powder diffraction phase analysis,” Adv. X-Ray Anal. AXRAAA 35, 115. axr, AXRAAA
Smith, D. K. (1997). “Evaluation of the detectability and quantification of respirable crystalline silica by X-ray powder diffraction methods,” Powder Diffr. PODIE2 12, 200227. pdj, PODIE2
Smith, D. K. (1998). “Opal, cristobalite and tridymite: Non-crystallinity versus crystallinity, Nomenclature of the silica minerals and bibliography,” Powder Diffr. PODIE2 13, 219. pdj, PODIE2
Smith, D. K., Tomaino, G. P., Wright, A. C., and Sinclair, R. N. (2001). “New data on the phases of opal,” submitted to Am. Mineral.

Review of questionnaire to AIHA accredited laboratories for the analysis of silica

  • Deane K. Smith (a1)

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