Microscopy and Microanalysis: Volume 16 -

RF Photoinjector Based Femtosecond Relativistic Electron Diffraction
P Musumeci, CM Scoby, JT Moody, M Westfall, MS Gutierrez
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01 August 2010, pp. 488-489
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

In Situ Transmission Electron Microscopy of Rapidly Solidifying Aluminum
A Kulovits, JMK Wiezorek, TB LaGrange, BW Reed, GH Campbell
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01 August 2010, pp. 490-491
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

High Brightness Nano-Patterned Photocathode Electron Sources for UEM
WA Schroeder, JA Berger, AW Nicholls, NJ Zaluzec, J Hiller, DJ Miller
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01 August 2010, pp. 492-493
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Ultrafast Electronic and Structural Phenomena in Graphite and Graphene
F Carbone, OH Kwon, A Cannizzo, F van Mourik, M Chergui, AH Zewail
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01 August 2010, pp. 494-495
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Ultrafast Electron Diffraction and Microscopy: Why We Should Know About Transient Electric Fields and Where They Come From
H Park, J-M Zuo
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01 August 2010, pp. 496-497
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Progress of Dynamical Nanomaterial Imaging Using Ultrashort Electron Pulses
Z Tao, H Zhang, RK Raman, T-T Han, K Chang, M Berz, C-Y Ruan
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01 August 2010, pp. 498-499
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Novel Picosecond Time-Resolved Cathodoluminescence to Probe Exciton Recombination Dynamics in GaN and GaN Based Heterostructures
S Sonderegger, P Corfdir, L Balet, T Zhu, A Dussaigne, D Martin, J Ristić, P Lefebvre, J-D Ganière, N Grandjean, B Deveaud-Plédran
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01 August 2010, pp. 500-501
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Nonlinear Photoemission Microscopy with Surface Plasmon Polaritons
F Meyer zu Heringdorf, N Buckanie
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01 August 2010, pp. 502-503
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

High-Speed Optical Microscopy of Spin-Like Reactions in Exothermic Nanolaminates
JP McDonald, ED Jones, Jr, VC Hodges, DP Adams
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01 August 2010, pp. 504-505
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Plasmon Loss Spectroscopy of Au/ZnO Nanoparticles: Prospects for Ultrafast Dynamics in Hybrid Nanostructures
T Norris, NJ Zaluzec, JF Mansfield, M Yang, N Kotov, M N'Gom, E Olsson
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01 August 2010, pp. 506-507
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Dynamic Nanoscale Imaging of Beam Sensitive Materials with In Situ Fluid Stage
KL Jungjohann, JE Evans, TB LaGrange, M Wall, MK Santala, BW Reed, GH Campbell, ND Browning
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01 August 2010, pp. 508-509
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Ultrafast Electron Microscope Column Design: An Efficient Semi-analytical Approach
JA Berger, WA Schroeder
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01 August 2010, pp. 510-511
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Dynamic Transmission Electron Microscope Investigations of Dynamic Processes in Materials
MK Santala, BW Reed, S Meister, TB LaGrange, JE Evans, GH Campbell, ND Browning
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01 August 2010, pp. 512-513
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Nanometer Resolution on a Femtosecond Timescale – First Experiments with pnCCDs for High Speed X-ray Imaging and Spectroscopy at LCLS
L Strüder, R Hartmann, H Soltau, P Holl, C Reich, N Kimmel, G Hauser
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01 August 2010, pp. 514-515
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Phase Plates Free From Contaminant Charging
K Nagayama, R Danev, H Shigematsu, Y Kayama, H Okawara, M Ohara, T Itoh, S Sugitani, A Kitayama
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01 August 2010, pp. 516-517
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

The Way to an Ideal Matter-free Zernike and Hilbert TEM Phase Plate: Anamorphotic Design and First Experimental Verification in Isotropic Optics
N Frindt, K Schultheiss, B Gamm, M Dries, J Zach, D Gerthsen, R Schröder
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01 August 2010, pp. 518-519
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Design for a Continuous-Wave Focused-Light Phase Plate for TEM
H Muller, J Jin, R Danev, JCH Spence, H Padmore, R Glaeser
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01 August 2010, pp. 520-521
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Improving on Phase Contrast by Extending the Range of Captured Spatial Frequencies in Transmission Electron Microscopy
C Kisielowski
Published online by Cambridge University Press:

01 August 2010, pp. 522-523
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Recording low Spatial Frequencies While Maintaining Information Limit Resolution Using the TEAM I Microscope
S Haigh, B Jiang, D Alloyeau, C Kisielowski, AI Kirkland
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01 August 2010, pp. 524-525
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Convenient Contrast Enhancement by Hole-Free Phase Plate in a TEM
M Malac, M Kawasaki, M Beleggia, P Li, RF Egerton
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01 August 2010, pp. 526-527
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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Volume 16 - July 2010

Instrumentation and Techniques Symposia

Ultrafast EM and the Effects of Ultrafast Events on the Structure and Chemistry of Materials

Abstract

RF Photoinjector Based Femtosecond Relativistic Electron Diffraction

In Situ Transmission Electron Microscopy of Rapidly Solidifying Aluminum

High Brightness Nano-Patterned Photocathode Electron Sources for UEM

Ultrafast Electronic and Structural Phenomena in Graphite and Graphene

Ultrafast Electron Diffraction and Microscopy: Why We Should Know About Transient Electric Fields and Where They Come From

Progress of Dynamical Nanomaterial Imaging Using Ultrashort Electron Pulses

Novel Picosecond Time-Resolved Cathodoluminescence to Probe Exciton Recombination Dynamics in GaN and GaN Based Heterostructures

Nonlinear Photoemission Microscopy with Surface Plasmon Polaritons

High-Speed Optical Microscopy of Spin-Like Reactions in Exothermic Nanolaminates

Plasmon Loss Spectroscopy of Au/ZnO Nanoparticles: Prospects for Ultrafast Dynamics in Hybrid Nanostructures

Dynamic Nanoscale Imaging of Beam Sensitive Materials with In Situ Fluid Stage

Ultrafast Electron Microscope Column Design: An Efficient Semi-analytical Approach

Dynamic Transmission Electron Microscope Investigations of Dynamic Processes in Materials

Nanometer Resolution on a Femtosecond Timescale – First Experiments with pnCCDs for High Speed X-ray Imaging and Spectroscopy at LCLS

TEM Phase Contrast Imaging in Biological and Materials Science

Abstract

Phase Plates Free From Contaminant Charging

The Way to an Ideal Matter-free Zernike and Hilbert TEM Phase Plate: Anamorphotic Design and First Experimental Verification in Isotropic Optics

Design for a Continuous-Wave Focused-Light Phase Plate for TEM

Improving on Phase Contrast by Extending the Range of Captured Spatial Frequencies in Transmission Electron Microscopy

Recording low Spatial Frequencies While Maintaining Information Limit Resolution Using the TEAM I Microscope

Convenient Contrast Enhancement by Hole-Free Phase Plate in a TEM

Microscopy and Microanalysis

Refine listing

Actions for selected content:

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Volume 16 - July 2010

Instrumentation and Techniques Symposia

Ultrafast EM and the Effects of Ultrafast Events on the Structure and Chemistry of Materials

Abstract

TEM Phase Contrast Imaging in Biological and Materials Science

Abstract