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This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
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PIT-1 Protein Localization at Different Optical Sections in a Single Living Cell Using FRET Microscopy and Green Fluorescent Proteins
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- Published online by Cambridge University Press:
- 02 July 2020, pp. 133-134
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A Study of Amorphous Chalcogenides by Electron Microscopy and Analysis
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- Published online by Cambridge University Press:
- 02 July 2020, pp. 714-715
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Are Common Atom Form Factors in HREM-Simulations Accurate Enough for Quantitative Image Matching?
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- 02 July 2020, pp. 1159-1160
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On the Structure-Function Relationships of the Unique Proteinase Inhibitor Human α2 Macroglobulin
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- 02 July 2020, pp. 986-987
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In situ FIB-Surface Preparation of Ag/SnO Composites for EBSD Measurements
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- 05 August 2007, pp. 1532-1533
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Microstructure of Yba2Cu3O7 Thick Films by Post Annealing of the Precursor by High Rate E-Beam Deposition On SrTiO3 Substrates
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- 02 July 2020, pp. 832-833
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Multi-length Scale X-ray Tomography using Laboratory and Synchrotron Sources
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- 05 August 2007, pp. 1570-1571
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Metrology in Scanning Electron Microscope
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- 05 August 2007, pp. 1058-1059
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Optical Imaging of Cancer Cells in vivo with Folate Receptor-Targeted Fluorescent Dyes
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- 05 August 2007, pp. 346-347
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X-ray Ultramicroscopy Within an XL30 Environmental SEM
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- 05 August 2007, pp. 1576-1577
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The Resolution of the SEM
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- Published online by Cambridge University Press:
- 02 July 2020, pp. 1173-1174
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APFIM Studies of Interfaces: Structure and Composition
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- 02 July 2020, pp. 114-115
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In-Depth Imaging Using Two-Photon Excitation Microscopy
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- 02 July 2020, pp. 420-421
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Near-Field Optical Spectroscopy: Enhancing the Light Budget
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- Published online by Cambridge University Press:
- 02 July 2020, pp. 815-816
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Field Emission TEM and STEM of Ultrafine Metal Particles
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- Published online by Cambridge University Press:
- 02 July 2020, pp. 389-390
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Edge Sharpening for Unbiased Edge Detection in Field Emission Scanning Electron Microscope Images
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- 31 July 2002, pp. 136-146
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Direct Imaging of Device Characteristics In a Focused ion Beam System
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- 02 July 2020, pp. 652-653
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Analyzing Mg and Fe in Olivines, Pyroxenes, and Garnets: Systematic Discrepancies
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- 02 July 2020, pp. 224-225
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Electron Microprobe Reference Materials for Geologic Analysis a Need for Developing Strategy
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- 02 July 2020, pp. 238-239
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An Investigation Into Beam Damage of Mesoporous Materials
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- Published online by Cambridge University Press:
- 02 July 2020, pp. 712-713
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