Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
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Transport of Secondary Electrons Through a Film of Condensed Water; Implications for Imaging Wet Samples
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- Published online by Cambridge University Press:
- 02 July 2020, pp. 1199-1200
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- Cited by 1
Improvements in Characterization of FIB Prepared Surfaces of Aluminum Using Xe+ Plasma FIB
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 272-273
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Microscopic and Spectroscopic Characterization of the Uranium Dinitride (UN2) Synthesized Using a Low Temperature Fluoride Route
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- Published online by Cambridge University Press:
- 05 August 2007, pp. 1036-1037
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In-situ TEM Analyses over FIB Lamellae - Investigating High Temperature Conversion of Solution Processed Mo-precursor to MoS2 Semiconductor Films.
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- 04 August 2017, pp. 258-259
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3D Visualization of Motor-Neurons in Mice Spinal Cord Using FIB\SEM Tomography
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- Published online by Cambridge University Press:
- 27 August 2014, pp. 1400-1401
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Electron Microscopy Characterization of Al2O3 and ZnO Coated Carbon Nanotubes
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- Published online by Cambridge University Press:
- 31 July 2006, pp. 676-677
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Three-dimensional Observation of Carbon Nanostructures with Confocal Scanning Tansmission Electron Microscopy
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- 26 July 2009, pp. 636-637
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Phase Separation in PM2000 Fe-Base ODS Alloy
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- 05 August 2007, pp. 1642-1643
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Spherical Particles in Al65Cu20Fe15 Alloy Prepared by Arc Melting
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- 01 August 2018, pp. 1032-1033
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Light and Electron Microscopic Study of Soft Bone Osteocytes From a Triceratops horridus Supraorbital Horn
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- 27 August 2014, pp. 1274-1275
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In Situ Transmission Electron Microscopy Observations of Silicidation Processes for Cobalt Thin Films Deposited on Silicon
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- 28 July 2005, pp. 317-324
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The Scanning Low Energy Electron Microscopy (SLEEM) Mode in SEM
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- 31 July 2006, pp. 152-153
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Particle Size Analysis for Fuel Cell Catalysts Using Electron Microscopy: Bright Field or HAADF Images?
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- Published online by Cambridge University Press:
- 23 November 2012, pp. 1364-1365
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Machine Learning on STEM-EDS Data for Quantifying Overlapping Deep-Mantle Rock Assemblages
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- Published online by Cambridge University Press:
- 30 July 2020, pp. 1878-1880
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Towards SIMS on the Helium Ion Microscope: Detection Limits and Experimental Results on the ORION
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- 09 October 2013, pp. 354-355
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The Effects of Maintaining Temperature in Annealing Heat Treatment for an FSWed 6061-T6 Al Alloy
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- 06 August 2013, pp. 69-72
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Surface Microanalysis with Slow Electrons
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- Published online by Cambridge University Press:
- 14 July 2006, pp. 347-351
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A Novel Method for Higher Order Aberration Correction in Electron Microscopes
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- 04 August 2017, pp. 472-473
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Towards Public Archiving of Large, Multi-Modal Imaging Datasets
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- 22 July 2022, pp. 1526-1527
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Importance of Aromatic Content for Peptide/Single-Walled Carbon Nanotube Interactions
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 1410-1411
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