Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 3
BF STEM Tomography for Improved 3D Imaging of Thick Biological Sections
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 572-573
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- Cited by 3
High-Resolution Scanning Transmission Electron Microscopy Study of Black Spot Defects in Ion Irradiated Silicon Carbide
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- Published online by Cambridge University Press:
- 27 August 2014, pp. 1824-1825
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Tomography and high resolution study of γ-Al2O3 porosity, surfaces and Pt surface interaction
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- Published online by Cambridge University Press:
- 23 November 2012, pp. 1302-1303
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Viability of Point Spread Function Deconvolution for SEM
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 126-127
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Development of Rapid Synchrotron 2D X-ray Mapping and XANES of Rock Slabs and Drill Core as a Tool for the Mineral Exploration and Mining Industries
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- Published online by Cambridge University Press:
- 10 August 2018, pp. 510-511
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Study on Evolution of Micropipes from Hexagonal Voids in 4H-SiC Crystals by Cathodoluminescence Imaging
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- 29 January 2021, pp. 215-226
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- Cited by 3
Letter to the Editor
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- Published online by Cambridge University Press:
- 01 August 2003, pp. 269-271
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Fusing Multi-scale and Multi-modal 3D Imaging and Characterization
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- 27 August 2014, pp. 820-821
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A Novel Strategy to Effectively Characterize FinFET Device by Multidirectional Comprehensive Analytical TEM in Semiconductor Wafer-foundries
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- 04 August 2017, pp. 336-337
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Deep Learning Enabled Measurements of Single-Atom Defects in 2D Transition Metal Dichalcogenides with Sub-Picometer Precision
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- 05 August 2019, pp. 172-173
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Towards Identification of Oxygen Point Defects by Means of Position Averaged CBED
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- 23 September 2015, pp. 1097-1098
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Structural and Elemental Three-Dimensional Analysis of Dentin Occlusion
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- 05 August 2019, pp. 434-435
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Position Normalization as a Tool to Extract Compositional and Microstructural Profiles from Backscatter and Secondary Electron Images
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- Published online by Cambridge University Press:
- 02 July 2020, pp. 1026-1027
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Time-Resolved Spectra from Millivolt EELS Data
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- Published online by Cambridge University Press:
- 30 May 2014, pp. 837-846
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Characterization of Contacting Boundaries between Nanoparticles with LACBED
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- 23 May 2003, pp. 237-244
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Enhancement of SEM/EDS Analysis Using FIB Sample Preparation
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- 02 July 2020, pp. 896-897
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A Model for Characteristic X-Ray Emission in Electron Probe Microanalysis Based on the (Filtered) Spherical Harmonic (
$P_{\rm N}$) Method for Electron Transport
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- Published online by Cambridge University Press:
- 11 April 2022, pp. 454-468
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Adsorption Behaviour of Creatine Phosphokinase onto Silicon Wafers: Comparison between Ellipsometric and Atomic Force Microscopy Data
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- 30 December 2005, pp. 56-60
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Physical Phase Plates for Cryo-Electron Microscopy of Biological Specimens: Comparison of Hole-Free Phase Plates and Zach Electrostatic Phase Plates
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- 01 August 2018, pp. 892-893
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BioImageXD - Free Microscopy Image Processing Software
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- 03 August 2008, pp. 724-725
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