Microscopy and Microanalysis: Volume 18 - Proceedings of Microscopy & Microanalysis 2012

STEM Analysis Of Cu(Mn) Self-Forming Diffusion Barriers on SiO2 For Applications In The Semiconductor Industry
J.G. Lozano, P. Nellist, J. Bogan, P. Casey, A. McCay, G. Hughes
Published online by Cambridge University Press:

23 November 2012, pp. 1842-1843
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Quantifying Octahedral Rotations in Ultrathin LaNiO3 Films Using Position Averaged Convergent Beam Electron Diffraction
J. Hwang, J.Y. Zhang, J. Son, S. Stemmer
Published online by Cambridge University Press:

23 November 2012, pp. 1844-1845
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Direct Observations of Retention Failure in Ferroelectric Memories by in situ Transmission Electron Microscopy
P. Gao, C. Nelson, J. Jokisaari, Y. Zhang, X. Pan, S. Baek, C. Bark, C. Eom
Published online by Cambridge University Press:

23 November 2012, pp. 1846-1847
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Characterization of Zinc Telluride Grown on Silicon by MBE
J. Kim, D.J. Smith, Y. Chen, G.N. Brill
Published online by Cambridge University Press:

23 November 2012, pp. 1848-1849
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Electron Energy-loss Spectroscopy Study on Boron Diffusion in Free Layer of Tunneling Magnetoresistance Thin Films with Ti Capping Layers
L. Chen, C. Yang, Q. Leng, H. Wang
Published online by Cambridge University Press:

23 November 2012, pp. 1850-1851
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Photoluminescence quenching of CdSe quantum dots by proximal binding of ferrocene redox moieties
W. Liu, S. Wang, X. Qiu
Published online by Cambridge University Press:

23 November 2012, pp. 1852-1853
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Imaging and Chemical Analysis of Core/Shell CdSe/CdS quantum dots using HR-STEM and Corrected HR-TEM
R.M. Dickerson, J.A. Hollingsworth, Y. Ghosh
Published online by Cambridge University Press:

23 November 2012, pp. 1854-1855
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Low Dose Imaging of Quantum Wells in the System CdSe-ZnSe
H.A. Calderon, I. Hernandez-Calderon, B. Barton, P. Specht, C. Kisielowski
Published online by Cambridge University Press:

23 November 2012, pp. 1856-1857
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Structure-Properties Relationship Study in GaP/GaOx Core-shell Nanowires and Nanochains Based Nanodevices
Y. Li, W. Zhou
Published online by Cambridge University Press:

23 November 2012, pp. 1858-1859
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Controlling axial p-n heterojunction abruptness through catalyst alloying in vapor-liquid-solid grown semiconductor nanowires
D.E. Perea, D.K. Schreiber, A. Devaraj, T. Thevuthasan, J. Yoo, S.A. Dayeh, S. Picraux
Published online by Cambridge University Press:

23 November 2012, pp. 1860-1861
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Absorption enhancement by Ni-silicide nanostructures embedded in ultra-thin Si films
R. Sachan, C. Gonzalez, O. Dyck, P. Rack, G. Duscher, R. Kalyanaraman, H. Garcia
Published online by Cambridge University Press:

23 November 2012, pp. 1862-1863
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

In-situ Observation of Dipolar Ferromagnetic Phase Transition in Fe3O4 Nanoparticle Arrays by Electron Holography and Lorentz Microscopy
K. Yamamoto, T. Hirayama, C.R. Hogg, S.A. Majetich, S. Yamamuro
Published online by Cambridge University Press:

23 November 2012, pp. 1864-1865
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Electron Microscopy Characterization of Nanometric ZrO2 and Er2O2S Synthetized from Organometallic Precursors.
D. Ávila-Brande, G. González-Rubio, L. Otero-Díaz, R. Perezzan, E. Urones-Garrote
Published online by Cambridge University Press:

23 November 2012, pp. 1866-1867
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Domain relaxation in La0.7Sr0.3MnO3/SrTiO3 thin films due to declamping
M. Nord, J.E. Boschker, T. Tybell, R. Holmestad, P.E. Vullum
Published online by Cambridge University Press:

23 November 2012, pp. 1868-1869
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

A Study on the Field Emission Property of Zinc Oxide Nanobelts by Insitu Transmission Electron Microscopy
A. Asthana, Y. Yap, R. Yassar
Published online by Cambridge University Press:

23 November 2012, pp. 1870-1871
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

In-Situ TEM Observation of Physical Degradation of AlGaN/GaN Devices under Applied Electric Field
H. Ghassemi, A. Lang, M. Taheri
Published online by Cambridge University Press:

23 November 2012, pp. 1872-1873
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Direct nano-scale correlation of structural and optical properties of lattice matched AlInN/AlGaN DBRs using helium temperature scanning transmission electron microscopy cathodoluminescence
F. Bertram, J. Christen, G. Schmidt, P. Veit, C. Berger, A. Krost
Published online by Cambridge University Press:

23 November 2012, pp. 1874-1875
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Stability Of InGaN/GaN MQW Luminescence Under Prolonged High Current Injection
M.R. Phillips
Published online by Cambridge University Press:

23 November 2012, pp. 1876-1877
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Highly spatially resolved Cathodoluminescence of Single GaN Quantum Dots directly performed in a Scanning Transmission Electron Microscope
G. Schmidt, M. Müller, F. Bertram, P. Veit, S. Petzold, A. Das, E. Monroy
Published online by Cambridge University Press:

23 November 2012, pp. 1878-1879
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Room temperature observation of magnetic chiral order in metallic thin films
G. Chen, J. Zhu, Y. Wu, A. Quesada, A. N'Diaye, A. Schmid
Published online by Cambridge University Press:

23 November 2012, pp. 1880-1881
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Proceedings of Microscopy & Microanalysis 2012

Physical Science Symposium

Microscopy and Analysis of Quantum Structures and Devices-05

Research Article

STEM Analysis Of Cu(Mn) Self-Forming Diffusion Barriers on SiO2 For Applications In The Semiconductor Industry

Quantifying Octahedral Rotations in Ultrathin LaNiO3 Films Using Position Averaged Convergent Beam Electron Diffraction

Direct Observations of Retention Failure in Ferroelectric Memories by in situ Transmission Electron Microscopy

Characterization of Zinc Telluride Grown on Silicon by MBE

Electron Energy-loss Spectroscopy Study on Boron Diffusion in Free Layer of Tunneling Magnetoresistance Thin Films with Ti Capping Layers

Microscopy and Analysis of Quantum Structures and Devices-06

Research Article

Photoluminescence quenching of CdSe quantum dots by proximal binding of ferrocene redox moieties

Imaging and Chemical Analysis of Core/Shell CdSe/CdS quantum dots using HR-STEM and Corrected HR-TEM

Low Dose Imaging of Quantum Wells in the System CdSe-ZnSe

Structure-Properties Relationship Study in GaP/GaOx Core-shell Nanowires and Nanochains Based Nanodevices

Controlling axial p-n heterojunction abruptness through catalyst alloying in vapor-liquid-solid grown semiconductor nanowires

Absorption enhancement by Ni-silicide nanostructures embedded in ultra-thin Si films

In-situ Observation of Dipolar Ferromagnetic Phase Transition in Fe3O4 Nanoparticle Arrays by Electron Holography and Lorentz Microscopy

Microscopy and Analysis of Quantum Structures and Devices-07

Research Article

Electron Microscopy Characterization of Nanometric ZrO2 and Er2O2S Synthetized from Organometallic Precursors.

Domain relaxation in La0.7Sr0.3MnO3/SrTiO3 thin films due to declamping

A Study on the Field Emission Property of Zinc Oxide Nanobelts by Insitu Transmission Electron Microscopy

In-Situ TEM Observation of Physical Degradation of AlGaN/GaN Devices under Applied Electric Field

Direct nano-scale correlation of structural and optical properties of lattice matched AlInN/AlGaN DBRs using helium temperature scanning transmission electron microscopy cathodoluminescence

Stability Of InGaN/GaN MQW Luminescence Under Prolonged High Current Injection

Highly spatially resolved Cathodoluminescence of Single GaN Quantum Dots directly performed in a Scanning Transmission Electron Microscope

Room temperature observation of magnetic chiral order in metallic thin films

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2012

Physical Science Symposium

Microscopy and Analysis of Quantum Structures and Devices-05

Research Article

Microscopy and Analysis of Quantum Structures and Devices-06

Research Article

Microscopy and Analysis of Quantum Structures and Devices-07

Research Article