Microscopy and Microanalysis: Volume 10 - Issue S02

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Volume 10 - Issue S02 - August 2004

Contents

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Aberration Correction, Electron Holography, High-Resolution TEM

Research Article

Performance of Monochromized and Aberration-Corrected TEMs
Gerd Benner, Erik Essers, Marko Matijevic, Alexander Orchowski, Peter Schlossmacher, Alexander Thesen, Maximilian Haider, Peter Hartel
Published online by Cambridge University Press:

01 August 2004, pp. 108-109
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

First Results from the Aberration-Corrected JEOL 2200FS-AC STEM/TEM
Lawrence F Allard, Douglas A Blom , Michael A O'Keefe, Chris J Kiely, D. Ackland, M. Watanabe, M. Kawasaki, T. Kaneyama, H. Sawada
Published online by Cambridge University Press:

01 August 2004, pp. 110-111
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Electron Holography with Cs-corrected TEM
Hannes Lichte, Dorin Geiger, Michael Lehmann, Max Haider, Bert Freitag
Published online by Cambridge University Press:

01 August 2004, pp. 112-113
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Physical Sciences Tutorial: Principles and Practice of Off-Axis Electron Holography

Research Article

Principles and Practice of Off-Axis Electron Holography
Martha R. McCartney
Published online by Cambridge University Press:

01 August 2004, pp. 114-115
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Physical Sciences Tutorial: Practical Scanning Transmission Electron Microscopy

Research Article

Practical Scanning Transmission Electron Microscopy
David A Muller
Published online by Cambridge University Press:

01 August 2004, pp. 116-117
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Micro X-ray Techniques: New Compositional and Structural Characterization Tools

Research Article

Multivariate Statistical Analysis of Wavelength and Energy-Dispersive X-ray Spectral Images
Paul G. Kotula, Michael R. Keenan, Richard P. Grant, Paul F. Hlava
Published online by Cambridge University Press:

01 August 2004, pp. 118-119
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Scanning Soft X-ray Microscopy and Diffraction Imaging
Janos Kirz, Tobias Beetz, Michael Feser, Holger Fleckenstein, Benjamin Hornberger, Malcolm Howells, Chris Jacobsen, Bjorg Larson, Mirna Lerotic, Enju Lima, Ming Lu, Huijie Miao, David Sayre, David Shapiro, Aaron Stein
Published online by Cambridge University Press:

01 August 2004, pp. 120-121
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

XEDS Systems for the Next Generation Analytical Electron Microscope
Nestor J. Zaluzec
Published online by Cambridge University Press:

01 August 2004, pp. 122-123
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

The X-ray Microscopy and Micro-Analysis Facility at the ESRF
Jean Susini, Murielle Salomé, Barbara Fayard, Diane Eichert, Olivier Dhez, Remi Tucoulou
Published online by Cambridge University Press:

01 August 2004, pp. 124-125
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Physical Sciences Tutorial: Energy Dispersive X-ray Spectometry in the Scanning Electron Microscope

Research Article

Energy Dispersive X-ray Spectrometry in the Scanning Electron Microscope
Dale E Newbury
Published online by Cambridge University Press:

01 August 2004, pp. 126-127
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

In-situ Characterization of Dynamic Processes by Variable Pressure Electron Microscopy

Research Article

Gas Amplification Master Curves for Low Vacuum and Environmental SEM
B L Thiel
Published online by Cambridge University Press:

01 August 2004, pp. 128-129
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

ETEM Issues and Opportunities for Dynamic In-situ Experiments
E D Boyes
Published online by Cambridge University Press:

01 August 2004, pp. 130-131
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Interactions Between Pigments in 19th and Early 20th Century Oil Paintings - In Situ Studies Using the Environmental Scanning Electron Microscope
Rachel White, Matthew R Phillips, Paul Thomas, Richard Wuhrer, Paula Dredge
Published online by Cambridge University Press:

01 August 2004, pp. 132-133
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Scanned Probe Microscopy: Probing Surfaces at the Nanoscale

Research Article

Molecular Design of Next-generation Single Walled Carbon Nanotubes-Polymer Composites
Lawrence A Bottomley, Mark A Poggi, Peter Lillehei
Published online by Cambridge University Press:

01 August 2004, pp. 134-135
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Combinatorial Gradient Reference Specimens for Advanced Scanned Probe Microscopy Techniques
Michael J Fasolka, Duangrut Julthongpiput, Eric J Amis, Tinh Nguyen, Xiaohong Gu
Published online by Cambridge University Press:

01 August 2004, pp. 136-137
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

AFM Measurements of Long, Isolated Single-Walled Carbon Nanotubes Wrapped with Peptide
Vasiliki Zorbas, Alfonso Ortiz-Acevedo, Alan B. Dalton , Gregg R. Dieckmann, Rockford K. Draper, Ray H Baughman, Inga H Musselman
Published online by Cambridge University Press:

01 August 2004, pp. 138-139
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Focused Ion Beam (FIB) / Dual Beam Applications and Techniques in Biological and Physical Sciences

Research Article

Comparative Study of Scanning Ion Microscope and Scanning Electron Microscope Images Using Monte Carlo Simulations
Tohru Ishitani, Kaoru Ohya
Published online by Cambridge University Press:

01 August 2004, pp. 140-141
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

FIB Specimen Preparation for STEM and EFTEM Tomography
Stephen M Schwarz, Lucille A Giannuzzi
Published online by Cambridge University Press:

01 August 2004, pp. 142-143
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Development and Fabrication of Multifunctional Scanning Probes and Sensors with Focused Ion Beam Techniques
Boris Mizaikoff, Christine Kranz
Published online by Cambridge University Press:

01 August 2004, pp. 144-145
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Sample Preparation of Fully Packaged Quantum Well Laser Diodes for STEM-EBIC Analysis
R. Garcia, K.L. Bunker, T.J. Kennedy, P.E. Russell
Published online by Cambridge University Press:

01 August 2004, pp. 146-147
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

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Microscopy and Microanalysis

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Volume 10 - Issue S02 - August 2004

Aberration Correction, Electron Holography, High-Resolution TEM

Research Article

Performance of Monochromized and Aberration-Corrected TEMs

First Results from the Aberration-Corrected JEOL 2200FS-AC STEM/TEM

Electron Holography with Cs-corrected TEM

Physical Sciences Tutorial: Principles and Practice of Off-Axis Electron Holography

Research Article

Principles and Practice of Off-Axis Electron Holography

Physical Sciences Tutorial: Practical Scanning Transmission Electron Microscopy

Research Article

Practical Scanning Transmission Electron Microscopy

Micro X-ray Techniques: New Compositional and Structural Characterization Tools

Research Article

Multivariate Statistical Analysis of Wavelength and Energy-Dispersive X-ray Spectral Images

Scanning Soft X-ray Microscopy and Diffraction Imaging

XEDS Systems for the Next Generation Analytical Electron Microscope

The X-ray Microscopy and Micro-Analysis Facility at the ESRF

Physical Sciences Tutorial: Energy Dispersive X-ray Spectometry in the Scanning Electron Microscope

Research Article

Energy Dispersive X-ray Spectrometry in the Scanning Electron Microscope

In-situ Characterization of Dynamic Processes by Variable Pressure Electron Microscopy

Research Article

Gas Amplification Master Curves for Low Vacuum and Environmental SEM

ETEM Issues and Opportunities for Dynamic In-situ Experiments

Interactions Between Pigments in 19th and Early 20th Century Oil Paintings - In Situ Studies Using the Environmental Scanning Electron Microscope

Scanned Probe Microscopy: Probing Surfaces at the Nanoscale

Research Article

Molecular Design of Next-generation Single Walled Carbon Nanotubes-Polymer Composites

Combinatorial Gradient Reference Specimens for Advanced Scanned Probe Microscopy Techniques

AFM Measurements of Long, Isolated Single-Walled Carbon Nanotubes Wrapped with Peptide

Focused Ion Beam (FIB) / Dual Beam Applications and Techniques in Biological and Physical Sciences

Research Article

Comparative Study of Scanning Ion Microscope and Scanning Electron Microscope Images Using Monte Carlo Simulations

FIB Specimen Preparation for STEM and EFTEM Tomography

Development and Fabrication of Multifunctional Scanning Probes and Sensors with Focused Ion Beam Techniques

Sample Preparation of Fully Packaged Quantum Well Laser Diodes for STEM-EBIC Analysis

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 10 - Issue S02 - August 2004

Aberration Correction, Electron Holography, High-Resolution TEM

Research Article

Physical Sciences Tutorial: Principles and Practice of Off-Axis Electron Holography

Research Article

Physical Sciences Tutorial: Practical Scanning Transmission Electron Microscopy

Research Article

Micro X-ray Techniques: New Compositional and Structural Characterization Tools

Research Article

Physical Sciences Tutorial: Energy Dispersive X-ray Spectometry in the Scanning Electron Microscope

Research Article

In-situ Characterization of Dynamic Processes by Variable Pressure Electron Microscopy

Research Article

Scanned Probe Microscopy: Probing Surfaces at the Nanoscale

Research Article

Focused Ion Beam (FIB) / Dual Beam Applications and Techniques in Biological and Physical Sciences

Research Article