Microscopy and Microanalysis: Volume 10 - Issue S02

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Volume 10 - Issue S02 - August 2004

Contents

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Metallography of High Temperature Materials & Component Life Assessment

Research Article

Development of Fine Microstructures on a Gamma-TiAl Alloy by Heat Treatment
M. Pérez-Bravo, I. Madariaga, A. Linaza, K. Ostolaza
Published online by Cambridge University Press:

01 August 2004, pp. 68-69
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

IMS Henry Clifton Sorby Award and Lecture

Research Article

Color Metallography
George Vander Voort
Published online by Cambridge University Press:

01 August 2004, pp. 70-71
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Stereology and 3D Digital Imaging

Research Article

Characterization of Porous Media by Local Porosities, Minkowski Functionals and Non-Minkowski Functionals
Rudolf Hilfer
Published online by Cambridge University Press:

01 August 2004, pp. 72-73
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

The Mean and Gaussian Curvature of Systems Undergoing Coarsening: Experiment and Theory
Roberto Mendoza, Igor Savin, Katsuyo Thornton, Peter W Voorhees
Published online by Cambridge University Press:

01 August 2004, pp. 74-75
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Metallography: Preparation, Application and Evaluation for the 21st Century

Research Article

A Study of Selective Etching of Carbides in Steel
George Vander Voort, Elena Manilova, J. R. Michael
Published online by Cambridge University Press:

01 August 2004, pp. 76-77
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Metallurgical Failure Analysis: Present and Future

Research Article

Toward a Global Analysis of Intermetallic Growth
Kirk Wiggins , Robert Champaign, Barbara Waller
Published online by Cambridge University Press:

01 August 2004, pp. 78-79
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Order in Disorder: Probing the Structure of Amorphous Materials

Research Article

Structure and Defects on the Nanometer Scale in Metallic Glasses
Todd C. Hufnagel
Published online by Cambridge University Press:

01 August 2004, pp. 80-81
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Different Oxide Structures Formed on Al and Si by Oxidation in Reactive Oxygen
Judith C. Yang
Published online by Cambridge University Press:

01 August 2004, pp. 82-83
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Physical Sciences Tutorial: Electron Diffaction for Modern materials Characterization

Research Article

Electron Diffraction for Modern Materials Characterization
J. M. Zuo
Published online by Cambridge University Press:

01 August 2004, pp. 84-85
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Electron Energy-Loss and X-ray Absorption Spectroscopies: Focus on Anisotropic Properties

Research Article

Detecting Structural and Bonding Changes in EELS Near-Edge Structures with a Monochromated TEM
G.A. Botton, M.-Y. Wu, C. Maunders, J. Etheridge, H.J. Whitfield
Published online by Cambridge University Press:

01 August 2004, pp. 86-87
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Magnetic Linear Dichroism in Electron Energy-Loss Spectra of alpha-Fe2O3
Peter A. van Aken, Stefan Lauterbach
Published online by Cambridge University Press:

01 August 2004, pp. 88-89
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

X-ray Absorption Near-edge and Pre-edge Structure: The Contributions of ab initio Plane-wave Pseudopotential Calculations and of Multiplet Theory
Delphine Cabaret, Emilie Gaudry, Francesco Mauri, Marie-Anne Arrio, Christian Brouder, Philippe Sainctavit, Frank de Groot
Published online by Cambridge University Press:

01 August 2004, pp. 90-91
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Theoretical and Experimental Study on Anisotropy of XANES/ELNES of Wide-Gap Materials
Teruyasu Mizoguchi, Masahiro Kunisu, Isao Tanaka, Atsutomo Nakamura, Katsuyuki Matsunaga, Takahisa Yamamoto, Yuichi Ikuhara, Wai Yim Ching
Published online by Cambridge University Press:

01 August 2004, pp. 92-93
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Quantitative X-ray Microanalysis

Research Article

Improving the Current Limits of Accuracy in Electron Probe Microanalysis of Geological Materials
John T. Armstrong
Published online by Cambridge University Press:

01 August 2004, pp. 94-95
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Nitrogen and Hydrogen in Natural Diamond, and other Stuff- Challenges of Correlative Microanalysis using Ions, Electrons and X-rays
Brendan J. Griffin, Richard Stern, Galina Bulanova, Rachael L Trautman
Published online by Cambridge University Press:

01 August 2004, pp. 96-97
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Synchrotron Radiation for the Characterization of Energy Dispersive X-ray Spectrometers
Mathias Procop, Frank Scholze
Published online by Cambridge University Press:

01 August 2004, pp. 98-99
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Theoretical Effect of Thin Films on the Detectability of Elements in the Substrate by X-Ray Microanalysis
Paula Horny, Raynald Gauvin, Eric Lifshin, Helen Campbell
Published online by Cambridge University Press:

01 August 2004, pp. 100-101
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Accessorizing the SEM

Research Article

High Resolution X-ray Microscopy in the Scanning Electron Microscope
Del Redfern, L A Brownlow, C J Sheffield-Parker, P R Miller, S. C. Mayo
Published online by Cambridge University Press:

01 August 2004, pp. 102-103
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Integrated XRF in the SEM
Brian John Cross, K C Witherspoon
Published online by Cambridge University Press:

01 August 2004, pp. 104-105
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

A Comparison of Microcalorimeter and Conventional Semiconductor EDS
Hendrix Demers, Raynald Gauvin, I M Anderson, D C Joy, E A Kenik
Published online by Cambridge University Press:

01 August 2004, pp. 106-107
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

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Volume 10 - Issue S02 - August 2004

Metallography of High Temperature Materials & Component Life Assessment

Research Article

IMS Henry Clifton Sorby Award and Lecture

Research Article

Stereology and 3D Digital Imaging

Research Article

Metallography: Preparation, Application and Evaluation for the 21st Century

Research Article

Metallurgical Failure Analysis: Present and Future

Research Article

Order in Disorder: Probing the Structure of Amorphous Materials

Research Article

Physical Sciences Tutorial: Electron Diffaction for Modern materials Characterization

Research Article

Electron Energy-Loss and X-ray Absorption Spectroscopies: Focus on Anisotropic Properties

Research Article

Quantitative X-ray Microanalysis

Research Article

Accessorizing the SEM

Research Article