Microscopy and Microanalysis: Volume 28 - Issue S1

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Physical Sciences Symposia

Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions

Interpretability of Low-Dose HRTEM Images of Supported Metal Nanoparticles

Spatial Differentiation of Aluminium Siting by the Single-Atom Adsorption Sites in Zeolite by Electron Microscopy

STEM-EELS Exploration of Beam-Sensitive Perovskite Nanocrystals

Combining Spatial and Temporal Resolution in Cryo-TEM of Device Materials

Studying Electronic Structure in Two-Dimensional Functionalized Organic-Metallic MXenes with Cryo-STEM

Understanding Structural and Chemical Modifications of ZIF MOF Under Electron-Beam Irradiation using STEM-EELS

Electron Beam Damage Mechanisms in Solution Phase Electron Microscopy of Metal-Organic Frameworks

Comparing Structural and Functional Changes of Biomolecules under Electron Irradiation with Liquid Cell Transmission Electron Microscopy

Atomic Structure of Hierarchical Few-Unit-Cell MFI Zeolites

Atomic-scale Fabrication of 1D-2D Nano Hetero-structures within 2D Materials through Automated Tracking and Electron Beam Control

Characterising and Minimising Damage Effects in Air- and Beam-sensitive Solid-state Li-ion Battery Materials

Digital Image Processing in C++ in SEM Images

Electron Backscatter Diffraction Analysis of Beam Sensitive Samples Using Direct Detection Technology

Formation of Defects in MoS2 during Data Acquisition of High-resolution Transmission Electron Microscopy

Investigating Sweet Spot Imaging of Perovskite Catalysts Bearing Exsolved Active Nanoparticles

Optimized Ultra-Fast Low Dose Electron Detection

Ways to Suppress Electron Beam Damage Using High-Speed Electron Beam Control by Electrostatic Shutter in Sample Observation and Analysis

Analysis of Complex, Beam-Sensitive Systems by Electron Microscopy

Resolving Electrode-Electrolyte Interfaces in Batteries with Low Dose Cryogenic Transmission Electron Microscopy

The Importance of the σ-hole in the Self-Assembly of Halogenated Polypeptoids

Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Physical Sciences Symposia

Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions