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Formation of Defects in MoS2 during Data Acquisition of High-resolution Transmission Electron Microscopy

Published online by Cambridge University Press:  22 July 2022

Cuauhtémoc Nuñez Valencia ,
Matthew Helmi Leth Larsen ,
William Bang Lomholdt ,
Daniel Kelly ,
Jakob Schiøtz  and
Thomas Willum Hansen
Cuauhtémoc Nuñez Valencia*
Affiliation:
DTU Physics, Technical University of Denmark, DK-2800 Kongens Lyngby, Denmark
Matthew Helmi Leth Larsen
Affiliation:
DTU Physics, Technical University of Denmark, DK-2800 Kongens Lyngby, Denmark
William Bang Lomholdt
Affiliation:
DTU Nanolab, Technical University of Denmark, DK-2800 Kongens Lyngby, Denmark
Daniel Kelly
Affiliation:
DTU Nanolab, Technical University of Denmark, DK-2800 Kongens Lyngby, Denmark
Jakob Schiøtz
Affiliation:
DTU Physics, Technical University of Denmark, DK-2800 Kongens Lyngby, Denmark
Thomas Willum Hansen
Affiliation:
DTU Nanolab, Technical University of Denmark, DK-2800 Kongens Lyngby, Denmark
*
*Corresponding author: cunva@dtu.dk

Abstract

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Type
Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2192 - 2193
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Copyright
Copyright © Microscopy Society of America 2022

References

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Egerton, R. F., Li, P., and Malac, M. Micron, 35 (2004), p. 399-409. doi: 10.1016/j.micron.2004.02.003CrossRefGoogle Scholar