139067 results in Materials Science
Identification of the NTD in hFACT Complex by Electron Microscopy
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 1162-1164
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- August 2022
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MMP20-ablated Induced Aberrant Mineralization in Early Secretory Enamel
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 1356-1358
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- August 2022
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Characterisation of Planar Defects in Ternary Layered Chalcogenides for Electronic Devices
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 2392-2393
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- August 2022
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Micromagnetics Simulation as a Supplement to and Diagnostic for Lorentz Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 1694-1696
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- August 2022
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Stability of Fe Electrode in Alkaline Electrolyte
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 830-832
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- August 2022
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The Reproducibility Crisis, a Comprehensive Set of Guides on XPS, and Better Data Fitting/Chemometrics of XPS Data
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 772-773
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- August 2022
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Novel Use of EXLO for Cryo-Manipulation of FIB Specimens
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, p. 80
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- August 2022
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Identifying Possible Two-Level-System Sources in Superconducting Qubit with Advanced Electron Microscopy
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 1716-1717
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- August 2022
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Comparison Between Deep Learning and Iterative Bayesian Statistics Deconvolution Methods in Energy Electron Loss Spectroscopy
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 3154-3156
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- August 2022
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Thicker Sections (300-500 nm) Observed in the Conventional TEM May Reveal Extended Structures Not Recognized in Ultrathin Sections
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 1470-1471
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- August 2022
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Reveal of Magnetic Domains and Tunable Supercell Structures in Two-dimensional Layered Oxide Thin Film via Differential Phase Contrast Imaging and Atomic-resolution STEM
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 1704-1705
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- August 2022
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Few-tilt Electron Ptychotomography: A New Method to Determine the 3D Structure of 2D Materials with High-precision and Low-dose
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 2526-2527
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- August 2022
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Diffuse Scattering from a RAFA Lens Produced High-Intensity, Far-Focused, Small 3D Virtual Source
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 3180-3181
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- August 2022
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Hardness Behavior in CNT/Al7075 RRA Heat Treated Composites
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 2832-2833
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- August 2022
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Towards the In-situ Detection of Spin Charge Accumulation at a Metal/Insulator Interface Using STEM-EELS Technique
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 2338-2339
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- August 2022
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Plasma FIB Applications in Life Science: From Large Volumes to Cryo-lamella Preparation
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 24-25
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- August 2022
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Raman Spectroscopy and Electron Microscopy Studies of Ga FIB and Post-FIB Ar Ion Milling's Impact on Si TEM Specimens
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 52-53
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- August 2022
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3D Visualization of Structural and Protein Compositional Changes in Plakophilin-2 Deficient Hearts
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 1448-1449
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- August 2022
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Focused Ion Beam Preparation of Low Melting Point Metals: Lessons Learned from Pb/Sn Solders
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 10-12
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- August 2022
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Towards Microsecond Time-Resolved Cryo-Electron Microscopy
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 1798-1799
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- August 2022
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