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Few-tilt Electron Ptychotomography: A New Method to Determine the 3D Structure of 2D Materials with High-precision and Low-dose

Published online by Cambridge University Press:  22 July 2022

Christoph Hofer ,
Kimmo Mustonen ,
Viera Skákalová  and
Timothy J. Pennycook
Christoph Hofer*
Affiliation:
Electron Microscopy for Material Science, University of Antwerp, Antwerp, Belgium.
Kimmo Mustonen
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria.
Viera Skákalová
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria. Institute of Electrical Engineering, Slovak Academy of Sciences, Bratislava, Slovakia
Timothy J. Pennycook
Affiliation:
Electron Microscopy for Material Science, University of Antwerp, Antwerp, Belgium.
*
*Corresponding author: christoph.hofer@uantwerpen.be

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2526 - 2527
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Copyright
Copyright © Microscopy Society of America 2022

References

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Research funded by European Research Council Grant no. 802123-HDEM.Google Scholar