4948 results in Electronic, optoelectronic devices, and nanotechnology
11 - MOS systems with high-k dielectrics
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- The MOS System
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Frontmatter
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10 - MOS systems with silicon dioxide dielectrics
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Contents
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Part I - Basic properties
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3 - Basic properties of the gate stack
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4 - Electron states at MOS interfaces
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7 - Electrical characterization by thermal activation
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8 - Characterization of oxide/silicon energy band alignment: internal photoemission and X-ray photoelectron spectroscopy
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2 - Basic properties of the MOS system
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- 25 September 2014, pp 11-31
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The MOS System
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9 - Electron spin-based methods
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6 - Electrical characterization by Fermi-probe technique
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- 25 September 2014, pp 131-167
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Part III - Real MOS systems
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Appendix C - A brief introduction to Fourier optics
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- An Introduction to Practical Laboratory Optics
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- 22 September 2014, pp 174-180
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12 - Practicalities
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Preface
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Index
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7 - Interferometers and their uses
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- 22 September 2014, pp 84-103
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8 - Electro-optical effects and their practical uses
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- 22 September 2014, pp 104-115
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