11 results
Advances in STEM and EELS: New Operation Modes, Detectors and Software
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 512-513
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- August 2019
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Energy-Filtered High-Angle Dark Field Mapping of Ultra-Light Elements
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 558-559
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- August 2014
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Tuning High Order Geometric Aberrations in Quadrupole-Octupole Correctors
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 928-929
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- August 2014
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Exploring Phonon Signals by High Energy / High Spatial Resolution EELS
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 66-67
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- August 2014
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Improving the Spatial Resolution of Low-keV STEM with a Monochromator
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 312-313
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- August 2013
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High Energy Resolution Monochromated EELS-STEM System
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1124-1125
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- August 2013
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Identification of Single Atoms Using Energy Dispersive X-ray Spectroscopy
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 976-977
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- July 2012
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Exploring new frontiers with the Nion aberration-corrected STEM
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1278-1279
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- July 2012
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SDD-EDS: Element Analysis of Nanostructures in TEM
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1058-1059
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- July 2012
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Dedicated STEM for 200 to 40 keV operation*
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- Journal:
- The European Physical Journal - Applied Physics / Volume 54 / Issue 3 / June 2011
- Published online by Cambridge University Press:
- 13 June 2011, 33505
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- June 2011
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Aberration-Corrected STEM for Elemental Mapping
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 16 July 2003, pp. 924-925
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- August 2003
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