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Aberration-Corrected STEM for Elemental Mapping

Published online by Cambridge University Press:  16 July 2003

N. Dellby
Affiliation:
Nion Co., 1102 8, thSt., Kirkland, WA 98033, USA
O.L. Krivanek
Affiliation:
Nion Co., 1102 8, thSt., Kirkland, WA 98033, USA
M. Murfitt
Affiliation:
Nion Co., 1102 8, thSt., Kirkland, WA 98033, USA
P.D. Nellist
Affiliation:
Nion Co., 1102 8, thSt., Kirkland, WA 98033, USA
Z.S. Szilagyi
Affiliation:
Nion Co., 1102 8, thSt., Kirkland, WA 98033, USA

Abstract

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Abstract
Copyright
Copyright © Microscopy Society of America 2003