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Intelligent and Automatic Parameter Optimization for High-resolution Electron Ptychography
Michael C. Cao, Zhen Chen, Yi Jiang, Yimo Han
Journal: Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
Published online by Cambridge University Press: 22 July 2022, pp. 3102-3103
Print publication: August 2022
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Assisting 4D-STEM Data Processing with Unsupervised Machine Learning
Yimo Han, Chuqiao Shi, Michael Cao, Yi Jiang
Journal: Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
Published online by Cambridge University Press: 22 July 2022, pp. 414-417
Print publication: August 2022
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Uncovering In-Plane Domain Structures in Two-Dimensional Ferroelectric SnSe Using Machine-Learning Assisted 4D-STEM
Chuqiao Shi, Nannan Mao, Jing Kong, Yimo Han
Journal: Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
Published online by Cambridge University Press: 22 July 2022, pp. 374-375
Print publication: August 2022
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Rapid and Semi-Automated Analysis of 4D-STEM data via Unsupervised Learning
Chuqiao Shi, Michael Cao, David Muller, Yimo Han
Journal: Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
Published online by Cambridge University Press: 30 July 2021, pp. 58-59
Print publication: August 2021
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Monolayer Graphene-covered Grids Enable 2.6-Å Single-particle Cryo-EM Reconstruction of 52-kDa Streptavidin
Yimo Han, Xiao Fan, Haozhe Wang, Fang Zhao, Christopher Tully, Jing Kong, Nan Yao, Nieng Yan
Journal: Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
Published online by Cambridge University Press: 30 July 2020, pp. 1030-1031
Print publication: August 2020
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Efficient Phase-contrast Imaging via Mixed-state Electron Ptychography: From Crystal Structures to Electromagnetic Fields
Zhen Chen, Yi Jiang, Michal Odstrcil, Yimo Han, Gregory Fuchs, David Muller
Journal: Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
Published online by Cambridge University Press: 30 July 2020, pp. 26-28
Print publication: August 2020
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Uncovering Atomic and Nano-scale Deformations in Two-dimensional Lateral Heterojunctions
Yimo Han, David Muller, Saien Xie, Jiwoong Park, Ming-Yang Li, Lain-Jong Li
Journal: Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
Published online by Cambridge University Press: 30 July 2020, pp. 1630-1631
Print publication: August 2020
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Phase Imaging beyond the Diffraction Limit with Electron Ptychography
David A. Muller, Zhen Chen, Yi Jiang, Michal Odstrcil, Yimo Han, Prafull Purohit, Mark W. Tate, Sol M. Gruner, Veit Elser
Journal: Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
Published online by Cambridge University Press: 05 August 2019, pp. 6-7
Print publication: August 2019
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AirSEM: Electron Microscopy in Air, without a Specimen Chamber
David A. Muller, Kayla X. Nguyen, Yimo Han, Barnaby D. A. Levin, Megan E. Holtz
Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
Published online by Cambridge University Press: 01 August 2018, pp. 342-343
Print publication: August 2018
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Real-space Demonstration of 0.4 Angstrom Resolution at 80 keV via Electron Ptychography with a High Dynamic Range Pixel Array Detector
Zhen Chen, Yi Jiang, Yimo Han, Pratiti Deb, Hui Gao, Saien Xie, Prafull Purohit, Mark W. Tate, Jiwoong Park, Sol M. Gruner, Veit Elser, David A. Muller
Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
Published online by Cambridge University Press: 01 August 2018, pp. 194-195
Print publication: August 2018
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Mapping Strain and Relaxation in 2D Heterojunctions with Sub-picometer Precision
Yimo Han, Kayla Nguyen, Michael Cao, Paul Cueva, Mark W. Tate, Prafull Purohit, Saien Xie, Ming-Yang Li, Lain-Jong Li, Jiwoong Park, Sol M. Gruner, David A. Muller
Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
Published online by Cambridge University Press: 01 August 2018, pp. 1588-1589
Print publication: August 2018
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Theory and Practice of Diffractometry on Single Tungsten Atoms using Electron Microscope Pixel Array Detectors
Michael C. Cao, Yimo Han, Yi Jiang, Kayla X Nguyen, Prafull Purohit, Mark W. Tate, Sol M Gruner, Veit Elser, David A. Muller
Journal: Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
Published online by Cambridge University Press: 04 August 2017, pp. 444-445
Print publication: July 2017
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Breaking Friedel’s Law in Polar Two Dimensional Materials
Pratiti Deb, Yimo Han, Saien Xie, Megan E. Holtz, Jiwoong Park, David A. Muller
Journal: Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
Published online by Cambridge University Press: 04 August 2017, pp. 1738-1739
Print publication: July 2017
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Picometer-Precision Strain Mapping of Two-Dimensional Heterostructures using an Electron Microscope Pixel Array Detector (EMPAD)
Yimo Han, Saien Xie, Kayla Nguyen, Michael Cao, Mark W. Tate, Prafull Purohit, Sol M. Gruner, Jiwoong Park, David A. Muller
Journal: Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
Published online by Cambridge University Press: 04 August 2017, pp. 1712-1713
Print publication: July 2017
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Enhanced Resolution from Full-Field Ptychography with an Electron Microscope Pixel Array Detector
Yi Jiang, Yimo Han, Zhen Chen, Veit Elser, David A. Muller
Journal: Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
Published online by Cambridge University Press: 04 August 2017, pp. 438-439
Print publication: July 2017
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Characterization of Sulfur and Nanostructured Sulfur Battery Cathodes in Electron Microscopy Without Sublimation Artifacts
Barnaby D.A. Levin, Michael J. Zachman, Jörg G. Werner, Ritu Sahore, Kayla X. Nguyen, Yimo Han, Baoquan Xie, Lin Ma, Lynden A. Archer, Emmanuel P. Giannelis, Ulrich Wiesner, Lena F. Kourkoutis, David A. Muller
Journal: Microscopy and Microanalysis / Volume 23 / Issue 1 / February 2017
Published online by Cambridge University Press: 23 February 2017, pp. 155-162
Print publication: February 2017
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Lithium sulfur (Li–S) batteries have the potential to provide higher energy storage density at lower cost than conventional lithium ion batteries. A key challenge for Li–S batteries is the loss of sulfur to the electrolyte during cycling. This loss can be mitigated by sequestering the sulfur in nanostructured carbon–sulfur composites. The nanoscale characterization of the sulfur distribution within these complex nanostructured electrodes is normally performed by electron microscopy, but sulfur sublimates and redistributes in the high-vacuum conditions of conventional electron microscopes. The resulting sublimation artifacts render characterization of sulfur in conventional electron microscopes problematic and unreliable. Here, we demonstrate two techniques, cryogenic transmission electron microscopy (cryo-TEM) and scanning electron microscopy in air (airSEM), that enable the reliable characterization of sulfur across multiple length scales by suppressing sulfur sublimation. We use cryo-TEM and airSEM to examine carbon–sulfur composites synthesized for use as Li–S battery cathodes, noting several cases where the commonly employed sulfur melt infusion method is highly inefficient at infiltrating sulfur into porous carbon hosts.

Electron Diffraction from a Single Atom and Optimal Signal Detection
David A. Muller, Yimo Han, Kayla X. Nguyen, Mark W. Tate, Prafull Purohit, Saien Xie, Jiwoong Park, Sol M. Gruner
Journal: Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
Published online by Cambridge University Press: 25 July 2016, pp. 846-847
Print publication: July 2016
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Strain Accommodation and Coherency in Laterally-Stitched WSe2/WS2Junctions
Yimo Han, Saien Xie, Benjamin Savitzky, Robert Hovden, Hui Gao, Lena F. Kourkoutis, Jiwoong Park, David A Muller
Journal: Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
Published online by Cambridge University Press: 25 July 2016, pp. 870-871
Print publication: July 2016
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Electron Microscopy in Air: Transparent Atomic Membranes and Imaging Modes
Yimo Han, Kayla Nguyen, Yui Ogawa, Hao Shi, Jiwoong Park, David A Muller
Journal: Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
Published online by Cambridge University Press: 23 September 2015, pp. 1111-1112
Print publication: August 2015
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19 results

Intelligent and Automatic Parameter Optimization for High-resolution Electron Ptychography

Assisting 4D-STEM Data Processing with Unsupervised Machine Learning

Uncovering In-Plane Domain Structures in Two-Dimensional Ferroelectric SnSe Using Machine-Learning Assisted 4D-STEM

Rapid and Semi-Automated Analysis of 4D-STEM data via Unsupervised Learning

Monolayer Graphene-covered Grids Enable 2.6-Å Single-particle Cryo-EM Reconstruction of 52-kDa Streptavidin

Efficient Phase-contrast Imaging via Mixed-state Electron Ptychography: From Crystal Structures to Electromagnetic Fields

Uncovering Atomic and Nano-scale Deformations in Two-dimensional Lateral Heterojunctions

Phase Imaging beyond the Diffraction Limit with Electron Ptychography

AirSEM: Electron Microscopy in Air, without a Specimen Chamber

Real-space Demonstration of 0.4 Angstrom Resolution at 80 keV via Electron Ptychography with a High Dynamic Range Pixel Array Detector

Mapping Strain and Relaxation in 2D Heterojunctions with Sub-picometer Precision

Theory and Practice of Diffractometry on Single Tungsten Atoms using Electron Microscope Pixel Array Detectors

Breaking Friedel’s Law in Polar Two Dimensional Materials

Picometer-Precision Strain Mapping of Two-Dimensional Heterostructures using an Electron Microscope Pixel Array Detector (EMPAD)

Enhanced Resolution from Full-Field Ptychography with an Electron Microscope Pixel Array Detector

Characterization of Sulfur and Nanostructured Sulfur Battery Cathodes in Electron Microscopy Without Sublimation Artifacts

Electron Diffraction from a Single Atom and Optimal Signal Detection

Strain Accommodation and Coherency in Laterally-Stitched WSe2/WS2Junctions

Electron Microscopy in Air: Transparent Atomic Membranes and Imaging Modes

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19 results