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Phase Imaging beyond the Diffraction Limit with Electron Ptychography

Published online by Cambridge University Press:  05 August 2019

David A. Muller*
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY 14853, USA
Zhen Chen
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA
Yi Jiang
Affiliation:
Department of Physics, Cornell University, Ithaca, NY 14853, USA
Michal Odstrcil
Affiliation:
Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland
Yimo Han
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA
Prafull Purohit
Affiliation:
Department of Physics, Cornell University, Ithaca, NY 14853, USA
Mark W. Tate
Affiliation:
Department of Physics, Cornell University, Ithaca, NY 14853, USA
Sol M. Gruner
Affiliation:
Department of Physics, Cornell University, Ithaca, NY 14853, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY 14853, USA
Veit Elser
Affiliation:
Department of Physics, Cornell University, Ithaca, NY 14853, USA
*
*Corresponding author: David.a.Muller@cornell.edu
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Abstract

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Type
Advances in Phase Retrieval Microscopy
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Tate, MW, et al. , Microscopy and Microanalysis 22 (2016), p. 237.CrossRefGoogle Scholar
[2]Maiden, A, et al. , Ultramicroscopy 109 (2009), p. 1256.CrossRefGoogle Scholar
[3]Jiang, Y., et al. , Nature 559, (2018), p343.CrossRefGoogle Scholar
[4]Allen, C. S., et al. ,. Microscopy and Microanalysis, 24(S1), (2018) p. 186187.CrossRefGoogle Scholar
[5]We thank Jiwoong Park, Saien Xie, Hui Gao, Ming-Hui Chiu, and Lain-Jong Li for samples. Research supported by US National Science Foundation (grants DMR-1539918, DMR-1429155, DMR-1719875) & US Department of Energy Basic Energy Sciences (DE-SC0005827).Google Scholar
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