19 results
Investigating Direct Focused Probe Ptychography for Single Particle Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 1284-1285
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- August 2022
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Few-tilt Electron Ptychotomography: A New Method to Determine the 3D Structure of 2D Materials with High-precision and Low-dose
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2526-2527
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- August 2022
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ab initio Electrostatic Potentials for 4D-STEM Ptychographic Reconstruction
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 392-393
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- August 2022
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Addressing Thickness Induced Contrast Reversals in Focused Probe Ptychography
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 360-361
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- August 2022
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A Hybrid Approach to Calibrate the Affine Transformation Between Scan-Camera Coordinates for 4D-STEM Datasets
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2532-2534
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- August 2022
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Accurate and Robust Calibration of the Uniform Affine Transformation Between Scan-Camera Coordinates for Atom-Resolved In-Focus 4D-STEM Datasets
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- Microscopy and Microanalysis / Volume 28 / Issue 3 / June 2022
- Published online by Cambridge University Press:
- 09 March 2022, pp. 622-632
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- June 2022
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Efficient Phase Contrast Imaging via Electron Ptychography, a Tutorial
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2684-2685
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- August 2019
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The Potential for Greater Clarity Cryo-Electron Microscopy via Ptychography
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 878-879
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- August 2018
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High Dose Efficiency Atomic Resolution Phase Imaging with Electron Ptychography
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 196-197
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- August 2018
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High Efficiency Phase Contrast Imaging In STEM Using Fast Direct Electron Pixelated Detectors
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2303-2304
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- August 2015
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STEM Optical Sectioning for Imaging Screw Displacements in Dislocation Core Structures
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 1927-1928
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- August 2015
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Probing Atomic Scale Dynamics with STEM
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 104-105
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- August 2014
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Maximum Efficiency STEM Phase Contrast Imaging
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 382-383
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- August 2014
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Defect Physics in Photovoltaic Materials Revealed by Combined High-Resolution Microscopy and Density-Functional Theory Calculation
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 514-515
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- August 2014
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Understanding Individual Defects in CdTe Solar Cells: From Atomic Structure to Electrical Activity
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 518-519
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- August 2014
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Optical Sectioning with Atomic Resolution Spectroscopy
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 584-585
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- August 2014
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STEM Optical Sectioning for Imaging Screw Displacements in Dislocation Core Structures
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 86-87
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- August 2014
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Core Structures of Dislocations within CdTe Grains
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1526 / 2013
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- 02 May 2013, mrsf12-1526-tt05-44
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- 2013
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Increased Ordering in the Amorphous SiOx due to Hyperthermal Atomic Oxygen.
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- MRS Online Proceedings Library Archive / Volume 851 / 2004
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- 01 February 2011, NN9.5
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- 2004
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