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Addressing Thickness Induced Contrast Reversals in Focused Probe Ptychography

Published online by Cambridge University Press:  22 July 2022

Chuang Gao ,
Christoph Hofer  and
Timothy J. Pennycook
Chuang Gao
Affiliation:
Electron Microscopy for Materials Science (EMAT), University of Antwerp, Antwerp, Belgium
Christoph Hofer
Affiliation:
Electron Microscopy for Materials Science (EMAT), University of Antwerp, Antwerp, Belgium
Timothy J. Pennycook*
Affiliation:
Electron Microscopy for Materials Science (EMAT), University of Antwerp, Antwerp, Belgium
*
*Corresponding author: timothy.pennycook@uantwerpen.be

Abstract

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Type
Developments of 4D-STEM Imaging - Enabling New Materials Applications
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 360 - 361
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Copyright
Copyright © Microscopy Society of America 2022

References

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Research funded by European Research Council Grant no. 802123-HDEM.Google Scholar