12 results
Si3H8 Based Epitaxy of Biaxially Stressed Silicon Films Doped with Carbon and Arsenic for Cmos Applications
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- Journal:
- MRS Online Proceedings Library Archive / Volume 864 / 2005
- Published online by Cambridge University Press:
- 01 February 2011, E4.30
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- 2005
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New Ge-Sn materials with adjustable bandgaps and lattice constants
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- MRS Online Proceedings Library Archive / Volume 744 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, M2.5
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- 2002
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Determination and Critical Assessment of the Optical Properties of Common Substrate Materials Used in III-V Nitride Heterostructures with Vacuum Ultraviolet Spectroscopic Ellipsometry
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- Journal:
- MRS Online Proceedings Library Archive / Volume 693 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, I8.3.1
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- 2001
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Spectroscopic Ellipsometry as a Potential In-Line Optical Metrology Tool For Relative Porosity Measurements of Low- K Dielectric Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 697 / January 2001
- Published online by Cambridge University Press:
- 17 March 2011, P4.7
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- January 2001
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Optical Vibrational and Structural Properties of Ge1−xSn x alloys by UHV-CVD
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- Journal:
- MRS Online Proceedings Library Archive / Volume 692 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, H11.4.1
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- 2001
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Theoretical and Experimental Analysis of the Low Dielectric Constant of Fluorinated Silica
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- Journal:
- MRS Online Proceedings Library Archive / Volume 612 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, D3.8.1
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- 2000
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Dielectric Function of AlN Grown on Si (111) by MBE
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- Journal:
- MRS Online Proceedings Library Archive / Volume 572 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 231
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- 1999
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Epitaxial Growth of AlN on Si Substrates with Intermediate 3C-SiC as Buffer Layers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 572 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 407
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- 1999
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Theoretical and Experimental Analysis of the Low Dielectric Constant of Fluorinated Silica
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- Journal:
- MRS Online Proceedings Library Archive / Volume 579 / 1999
- Published online by Cambridge University Press:
- 15 February 2011, 255
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- 1999
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3C-SiC Buffer Layers Converted from Si at a Low Temperature
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- Journal:
- MRS Online Proceedings Library Archive / Volume 572 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 219
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- 1999
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Spectroscopic Ellipsometry and Band Structure of Si1–yCy Alloys Grown Pseudomorphically on Si (001)
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- Journal:
- MRS Online Proceedings Library Archive / Volume 379 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 205
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- 1995
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Optical Characteristics of Porous Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 256 / 1991
- Published online by Cambridge University Press:
- 15 February 2011, 189
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- 1991
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