Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Colossal ionic conductivity was recently discovered in YSZ/SrTiO3 multilayers and was explained in terms of strain- and interface-enhanced disorder of the O sublattice. In the present paper we use a combination of scanning transmission electron microscopy and electron energy loss spectroscopy (EELS) and theoretical EELS simulations to confirm the presence of a disordered YSZ O sublattice in coherent YSZ/SrTiO3 multilayers. O K-edge fine structure simulated for the strained disordered O sublattice phase of YSZ possesses blurred-out features compared to that of ordered cubic bulk YSZ, and experimental EELS fine structure taken from the strained YSZ of coherent YSZ/SrTiO3 thin films is similarly blurred out. Elemental mapping is shown to be capable of resolving ordered YSZ O sublattices. Elemental mapping of O in the coherent YSZ/STO multilayers is presented in which the O sublattice is seen to be clearly resolved in the STO but blurred out in the YSZ, indicating it to be disordered. In addition, we present imaging and EELS results which show that strained regions exist at the incoherent interfaces of YSZ islands in STO with blurred out fine structure, suggesting these incoherent regions may also support high ionic conductivities. Recently, Cavallaro et al. reported electronic conductivities in samples of incoherent disconnected islands embedded in STO that are similar to the islands described herein. The presence of a region of O depleted STO at the interface with incoherent YSZ islands is revealed by EELS elemental mapping, implying the n-type doping of STO/YSZ nanocomposites with disconnected incoherent YSZ islands.

The ability of electron microscopes to analyze all the atoms in individual nanostructures is limited by lens aberrations. However, recent advances in aberration-correcting electron optics have led to greatly enhanced instrument performance and new techniques of electron microscopy. The development of an ultrastable electron microscope with aberration-correcting optics and a monochromated high-brightness source has significantly improved instrument resolution and contrast. In the present work, we report information transfer beyond 50 pm and show images of single gold atoms with a signal-to-noise ratio as large as 10. The instrument's new capabilities were exploited to detect a buried Σ3 {112} grain boundary and observe the dynamic arrangements of single atoms and atom pairs with sub-angstrom resolution. These results mark an important step toward meeting the challenge of determining the three-dimensional atomic-scale structure of nanomaterials.

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006