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Determination of the Strain Field in Nano-Objects from Aberration-Corrected Z-contrast Images

Published online by Cambridge University Press:  05 August 2007

SI Molina ,
M Varela ,
DL Sales ,
T Ben ,
J Pizarro ,
PL Galindo ,
D Fuster ,
Y Gonzalez ,
L Gonzalez  and
S Pennycook
SI Molina
Affiliation:
University of Cadiz,Spain
M Varela
Affiliation:
Oak Ridge National Laboratory
DL Sales
Affiliation:
University of Cadiz,Spain
T Ben
Affiliation:
University of Cadiz,Spain
J Pizarro
Affiliation:
University of Cadiz,Spain
PL Galindo
Affiliation:
University of Cadiz,Spain
D Fuster
Affiliation:
Institute of Microelectronic of Madrid,Spain
Y Gonzalez
Affiliation:
Institute of Microelectronic of Madrid,Spain
L Gonzalez
Affiliation:
Institute of Microelectronic of Madrid,Spain
S Pennycook
Affiliation:
Oak Ridge National Laboratory
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 746 - 747
Copyright
© 2007 Microscopy Society of America

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