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Analysis of Radiation Damage in Lysozyme Crystals with High Resolution Triple Axis X-Ray Diffraction
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- Journal:
- MRS Online Proceedings Library Archive / Volume 711 / 2001
- Published online by Cambridge University Press:
- 17 March 2011, FF2.4.1
- Print publication:
- 2001
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Dislocation Arrangement in a Thick LEO GaN Film on Sapphire
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- Journal:
- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 5 / Issue S1 / 2000
- Published online by Cambridge University Press:
- 13 June 2014, pp. 97-103
- Print publication:
- 2000
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Dislocation Arrangement in a Thick LEO GaN Film on Sapphire
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- Journal:
- MRS Online Proceedings Library Archive / Volume 595 / 1999
- Published online by Cambridge University Press:
- 03 September 2012, F99W2.11
- Print publication:
- 1999
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Characterization of Reactive Ion Etch Damage in GaAs by Triple Crystal X-Ray Diffraction
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- Journal:
- MRS Online Proceedings Library Archive / Volume 324 / 1993
- Published online by Cambridge University Press:
- 22 February 2011, 445
- Print publication:
- 1993
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Surface Characterization of Chemical-Mechanical Polished GaAs by Inclined Bragg Plane Triple Crystal X-Ray Diffraction
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- Journal:
- MRS Online Proceedings Library Archive / Volume 259 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 335
- Print publication:
- 1992
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Fundamental issues in heteroepitaxy—A Department of Energy, Council on Materials Science Panel Report*
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- Journal:
- Journal of Materials Research / Volume 5 / Issue 4 / April 1990
- Published online by Cambridge University Press:
- 31 January 2011, pp. 852-894
- Print publication:
- April 1990
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