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Analysis of Radiation Damage in Lysozyme Crystals with High Resolution Triple Axis X-Ray Diffraction

Published online by Cambridge University Press:  17 March 2011

Richard J. Matyi
Affiliation:
Physics Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899
Heather M. Volz
Affiliation:
Materials Science Program, University of Wisconsin, Madison, WI 53706 (current address: IBM Microelectronics, Essex Junction, VT 05452)
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Abstract

High resolution triple axis X-ray diffraction has been used to monitor the effects of X-ray radiation damage in hen egg white lysozyme crystals. At long irradiation the expected decrease in peak intensity and increase in the angular extent of the peak breadth was seen. In contrast, both the intesi-ties and peak breadths exhibited more complex behavior during the initial stages of irradiation. Possible reasons for these observations are discussed.

Type
Research Article
Copyright
Copyright © Materials Research Society 2002

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References

REFERENCES

1. Drenth, J., Principles of Protein X-Ray Crystallography (2nd ed.). New York: Springer-Verlag (1999).Google Scholar
2. Shaikevitch, A. and Kam, Z., Acta Cryst. A 37, 871 (1981).Google Scholar
3. Fourme, R., Ducruix, A., Ries-Kautt, M., and Capelle, R., J. Synch. Rad. 2, 136 (1995).Google Scholar
4. Helliwell, J.R., J. Cryst. Growth 90, 259 (1988).Google Scholar
5. Colapietro, M., Cappuccio, G., Marciante, C., Pifferi, A., Spagna, R., and Helliwell, J.R., J. Appl. Cryst. 25, 192 (1992).Google Scholar
6. Snell, E.H., Weisgerber, S., Helliwell, J.R., Weckert, E., Hölzer, K., and Schroer, K., Acta Cryst. D 51, 1099 (1995).Google Scholar
7. Izumi, K., Sawamura, S., and Ataka, M., J. Cryst. Growth 168, 106 (1996).Google Scholar
8. Stojanoff, V., Siddons, D.P., Monaco, L.A., Vekilov, P., and Rosenberger, F., Acta Cryst. D 53, 588 (1997).Google Scholar
9. Caylor, C.L., Dobrianov, I., Lemay, S.G., Kimmer, C., Kriminski, S., Finkelstein, K.D., Zipfel, Z., Thomas, B.R., Chernov, A.A., and Thorne, R.E., Proteins-Structure Function and Genetics 36, 270 (1999).Google Scholar
10. Dobrianov, I., Caylor, C., Lemay, S.G., Finkelstein, K.D., and Thorne, R.E., J. Cryst. Growth 196, 511 (1999).Google Scholar
11. Volz, H.M. and Matyi, R.J., Philos. Trans. R. Soc. London, Ser. A 357, 2789 (1999).Google Scholar
12. Volz, H.M. and Matyi, R.J., Acta Cryst. D 56, 881 (2000).Google Scholar
13. Volz, H.M. and Matyi, R.J., J. Cryst. Growth 232, 502 (2001).Google Scholar
14.Certain commercial equipment, instruments, or materials are identified in this paper to foster understanding. Such identification does not imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the materials or equipment identified are necessarily the best available for the purpose.Google Scholar
15. Matyi, R.J., Moran, P.D., Hagquist, W.W.D., and Volz, H.M., Rev. Sci. Instr. 71, 2292 (2000).Google Scholar
16. Volz, H.M. and Matyi, R.J., J. Cryst. Growth (submitted).Google Scholar
17. Holy, V., Pietch, U. and Baumbach, T., High-Resolution X-Ray Scattering from Thin Films and Multilayers. Berlin: Springer-Verlag (1999).Google Scholar