8 results
Progress in Ultra-High Energy Resolution EELS
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 628-629
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- August 2019
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First-Principles Modeling of Vibrational Electron Energy Loss Spectra
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 602-603
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- August 2019
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Annular Dark-Field Imaging of Atomic Substitution in Single-Layer Materials
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 74-75
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- July 2010
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Slow and Fast Atomic Motion Observed by Aberration-Corrected STEM
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 70-71
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- July 2010
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Processing and Aberration-Corrected Imaging of Novel Low-Dimensional Nanostructures
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 76-77
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- July 2010
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Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 132-133
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- August 2008
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Atomic-Resolution STEM at 60kV Primary Voltage
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 136-137
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- August 2008
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High-stability, Highly Automated Double-eucentric (S)TEM Sample Stage
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1104-1105
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- August 2006
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