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High-stability, Highly Automated Double-eucentric (S)TEM Sample Stage

Published online by Cambridge University Press:  31 July 2006

CS Own
Affiliation:
Nion Company
GJ Corbin
Affiliation:
Nion Company
N Dellby
Affiliation:
Nion Company
BF Elston
Affiliation:
Nion Company
RJ Keyse
Affiliation:
Nion Company
MF Murfitt
Affiliation:
Nion Company
ZS Szilagyi
Affiliation:
Nion Company
OL Krivanek
Affiliation:
Nion Company

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Copyright
© 2006 Microscopy Society of America