Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Dellby, N.
Bacon, N.J.
Hrncirik, P.
Murfitt, M.F.
Skone, G.S.
Szilagyi, Z.S.
and
Krivanek, O.L.
2011.
Dedicated STEM for 200 to 40 keV operation.
The European Physical Journal Applied Physics,
Vol. 54,
Issue. 3,
p.
33505.
Krivanek, Ondrej L.
Chisholm, Matthew F.
Dellby, Niklas
and
Murfitt, Matthew F.
2011.
Scanning Transmission Electron Microscopy.
p.
615.
Hotz, Michael T.
Corbin, George
Delby, Niklas
Lovejoy, Tracy C.
Skone, Gwyn
Blazit, Jean-Denis
Kociak, Mathieu
Stephan, Odile
Tencé, Marcel
Zandbergen, Henny W.
and
Krivanek, Ondrej L.
2017.
Stable and Flexible Side-Entry Stage for Nion STEMs.
Microscopy and Microanalysis,
Vol. 23,
Issue. S1,
p.
54.