3 results
Annular Dark-Field Imaging of Atomic Substitution in Single-Layer Materials
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 74-75
- Print publication:
- July 2010
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Slow and Fast Atomic Motion Observed by Aberration-Corrected STEM
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 70-71
- Print publication:
- July 2010
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High-stability, Highly Automated Double-eucentric (S)TEM Sample Stage
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1104-1105
- Print publication:
- August 2006
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