11 results
Visibility and Apparent Size of Néel-Type Magnetic Skyrmions in Fresnel Defocus Images of Multilayer Films
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue 6 / December 2021
- Published online by Cambridge University Press:
- 18 October 2021, pp. 1356-1365
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- December 2021
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Live Processing of Momentum-Resolved STEM Data for First Moment Imaging and Ptychography
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- Microscopy and Microanalysis / Volume 27 / Issue 5 / October 2021
- Published online by Cambridge University Press:
- 05 August 2021, pp. 1078-1092
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- October 2021
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Automated mapping of the crystallographic sample orientation from diffraction patterns in momentum-resolved STEM
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1444-1445
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- August 2021
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Quantitative characterization of nanometer-scale electric fields via momentum-resolved STEM
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2206-2207
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- August 2021
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Towards quantitative elemental mapping across interfaces by combining momentum-resolved STEM and EDX
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 604-607
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- August 2021
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Direct Mapping of Electrostatic Potentials by Momentum-resolved STEM and Electron Holography - A Conceptual Comparison
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
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- 30 July 2020, pp. 18-20
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- August 2020
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Quantitative Simulation of Four-dimensional STEM Datasets
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 250-251
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- August 2020
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Quantitative STEM: Comparative Studies of Composition and Optical Properties of Semiconductor Quantum Structures
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1690-1691
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- July 2017
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Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 484-485
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- July 2016
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STEM Strain Measurement From a Stream of Diffraction Patterns Recorded on a Pixel-Free Delay-Line Detector
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 520-521
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- July 2016
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Sample Tilt Effects on Atom Column Position Determination in ABF-STEM Imaging
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 890-891
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- July 2016
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