3 results
TEM Imaging of Edges and Point Defects in Monolayer Phosphorene
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2348-2350
- Print publication:
- August 2020
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TEM Imaging and Electron Diffraction of Vertically Stacked Graphene/h-BN with Fine Control of Twist Angle
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2114-2115
- Print publication:
- August 2019
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Atomic-Resolution TEM Imaging of Phosphorene Protected by Graphene
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1696-1697
- Print publication:
- August 2019
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