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Atomic-Resolution TEM Imaging of Phosphorene Protected by Graphene

Published online by Cambridge University Press:  05 August 2019

Yangjin Lee ,
Jun-Yeong Yoon ,
Hu Young Jeong  and
Kwanpyo Kim
Yangjin Lee
Affiliation:
Department of Physics, Yonsei University, Seoul, Republic of Korea. Center for Nanomedicine, Institute of Basic Science (IBS), Seoul, Republic of Korea.
Jun-Yeong Yoon
Affiliation:
Department of Physics, Yonsei University, Seoul, Republic of Korea. Center for Nanomedicine, Institute of Basic Science (IBS), Seoul, Republic of Korea.
Hu Young Jeong
Affiliation:
UNIST Central Research Facilities (UCRF), Ulsan National Institute of Science and Technology (UNIST), Ulsan, Republic of Korea.
Kwanpyo Kim*
Affiliation:
Department of Physics, Yonsei University, Seoul, Republic of Korea. Center for Nanomedicine, Institute of Basic Science (IBS), Seoul, Republic of Korea.
*
*Corresponding author: kpkim@yonsei.ac.kr

Abstract

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Type
Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1696 - 1697
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Ling, X. et al. , Proc. Natl. Acad. Sci. U. S. A. 112 (2015) 4523.Google Scholar
[2]Lee, Y. et al. , J Phys. D. J. Phys. D: Appl. Phys. 50 (2017) 084003.Google Scholar
[3]Algara-Siller, G. et al. , Appl. Phys. Lett. 103 (2013) 203107.Google Scholar
[4]Lehnert, T. et al. , Appl. Phys. Lett. 110 (2017) 033106.Google Scholar
[5]The authors acknowledge funding from the Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (NRF-2017R1A5A1014862) and the Institute for Basic Science (IBS-R026-D1).Google Scholar