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TEM Imaging of Edges and Point Defects in Monolayer Phosphorene

Published online by Cambridge University Press:  30 July 2020

Yangjin Lee ,
Sol Lee ,
Jun-Yeong Yoon ,
Jinwoo Cheon ,
Hu Young Jeong  and
Kwanpyo Kim
Yangjin Lee
Affiliation:
Yonsei University, Seoul, Seoul-t'ukpyolsi, Republic of Korea
Sol Lee
Affiliation:
Yonsei University, Seoul, Seoul-t'ukpyolsi, Republic of Korea
Jun-Yeong Yoon
Affiliation:
Yonsei University, Seoul, Seoul-t'ukpyolsi, Republic of Korea
Jinwoo Cheon
Affiliation:
Yonsei University, Seoul, Seoul-t'ukpyolsi, Republic of Korea
Hu Young Jeong
Affiliation:
Ulsan National Institute of Science and Technology (UNIST), Ulsan, Ulsan-gwangyoksi, Republic of Korea
Kwanpyo Kim
Affiliation:
Yonsei University, Seoul, Seoul-t'ukpyolsi, Republic of Korea

Abstract

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Type
New Frontiers in Electron Microscopy of Two-dimensional Materials
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2348 - 2350
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Copyright
Copyright © Microscopy Society of America 2020

References

Ling, X., et al. ., Proc. Natl. Acad. Sci. U. S. A. 112 (2015) 4523.10.1073/pnas.1416581112CrossRefGoogle Scholar
Lee, Y., et al. , J Phys. D. J. Phys. D: Appl. Phys. 50 (2017) 084003.10.1088/1361-6463/aa5583CrossRefGoogle Scholar
Lee, Y. et al. ., Nano Lett. 20 (2020) 559-566.10.1021/acs.nanolett.9b04292CrossRefGoogle Scholar
The authors acknowledge funding from the Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (NRF-2017R1A5A1014862, NRF-2018R1A2B6008104) and the Institute for Basic Science (IBS-R026-D1).Google Scholar