6 results
Three-Dimensional Time-of-Flight Secondary Ion Mass Spectrometry and DualBeam FIB/SEM Imaging of Lithium-ion Battery Cathode
-
- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 876-877
- Print publication:
- August 2019
-
- Article
-
- You have access
- Export citation
Not recognized enough: The effects and associations of trauma and intellectual disability in severely mentally ill outpatients
-
- Journal:
- European Psychiatry / Volume 58 / May 2019
- Published online by Cambridge University Press:
- 02 March 2019, pp. 63-69
-
- Article
-
- You have access
- Open access
- HTML
- Export citation
Applications of an in-situ Low Energy Argon Ion Source for Improvement of TEM and SEM Sample Quality
-
- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 298-299
- Print publication:
- July 2017
-
- Article
-
- You have access
- Export citation
Electron Beam-Induced Deposition for Atom Probe Tomography Specimen Capping Layers
-
- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue 2 / April 2017
- Published online by Cambridge University Press:
- 17 October 2016, pp. 321-328
- Print publication:
- April 2017
-
- Article
- Export citation
A Static Low Energy Ion Source for Local Surface Modification
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 630-631
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation
Creation of Patterned Gold Nanostructures via Electron-Beam-Induced Deposition
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 1546 / 2013
- Published online by Cambridge University Press:
- 15 May 2013, mrss13-1546-l06-35
- Print publication:
- 2013
-
- Article
- Export citation