27 results
Intermediate Annealing Behavior And Grain Growth Of Al-Cu-Fe Quasicrystalline Coatings
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- Journal:
- MRS Online Proceedings Library Archive / Volume 749 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, W12.7
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- 2002
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Correlation of Stress and Phase Evolution in Thin Ta Films On Si (100) During Thermal Testing
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- MRS Online Proceedings Library Archive / Volume 750 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, Y8.8
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- 2002
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In situ Fracture and Adhesion Failure of Al-Cu-Fe Quasicrystalline Films
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- MRS Online Proceedings Library Archive / Volume 750 / 2002
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- 11 February 2011, Y3.3
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- 2002
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Real-Time in Situ Imaging of the Delamination of thin Ta Films on Si(100) Substrates Via a Synchrotron Radiation Technique
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- MRS Online Proceedings Library Archive / Volume 695 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, L9.2.1
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- 2001
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Deposition Kinetics and Microstructural Evolution in Sputtered TA Films: a Real-Time/In-Situ Study
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- MRS Online Proceedings Library Archive / Volume 562 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 141
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- 1999
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Probing Stress State and Phase Content in Ultra-Thin Ta Films
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- MRS Online Proceedings Library Archive / Volume 524 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 115
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- 1998
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Degree of Crystallinity and Strain in B4C and SiC Thin Films as a Function of Processing Conditions
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- MRS Online Proceedings Library Archive / Volume 524 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 109
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- 1998
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Real time In Situ X-Ray Topographic Observation of Deformation of Single Crystals and Thin Films
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- MRS Online Proceedings Library Archive / Volume 524 / 1998
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- 10 February 2011, 81
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- 1998
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On The Measurement Of Residual Stress In Thin Films
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- MRS Online Proceedings Library Archive / Volume 505 / 1997
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- 10 February 2011, 519
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- 1997
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Structure Determination of B4C and SiC Thin Films Via Synchrotron High-Resolution Diffraction
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- MRS Online Proceedings Library Archive / Volume 505 / 1997
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- 10 February 2011, 635
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- 1997
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Real Time Observation of Material Deformation Processes by Synchrotron White Beam X-ray Topography
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- MRS Online Proceedings Library Archive / Volume 502 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 163
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- 1997
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Native Oxide and the Residual Stress of Thin Mo and Ta Films
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- MRS Online Proceedings Library Archive / Volume 441 / 1996
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- 10 February 2011, 385
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- 1996
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The Role of Roughness in Texture Development
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- MRS Online Proceedings Library Archive / Volume 440 / 1996
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- 15 February 2011, 241
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- 1996
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Origins of Residual Stress in Mo and Ta Films: the Role of Impurities, Microstructural Evolution, and Phase Transformations
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- MRS Online Proceedings Library Archive / Volume 436 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 505
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- 1996
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Depth-Sensitive Strain Analysis of a W/Ta/W Trilayer
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- Journal:
- MRS Online Proceedings Library Archive / Volume 441 / 1996
- Published online by Cambridge University Press:
- 10 February 2011, 379
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- 1996
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Origin of In-Plane Texturing in Sputtered Mo Films
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- MRS Online Proceedings Library Archive / Volume 403 / 1995
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- 15 February 2011, 33
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- 1995
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Depth Dependence of Residual Strains in Textured Mo Thin Films Using High-Resolution X-Ray Diffraction
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- MRS Online Proceedings Library Archive / Volume 403 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 127
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- 1995
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Principal Residual Strains as A function of Depth for Sputter Deposited Mo Thin Films
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- MRS Online Proceedings Library Archive / Volume 356 / 1994
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- 21 February 2011, 603
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- 1994
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Tailoring of Mechanical Properties in Microlaminates
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- MRS Online Proceedings Library Archive / Volume 308 / 1993
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- 15 February 2011, 759
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- 1993
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Phase Identification in Rapidly Solidified Al-In Alloys Using High Resolution Synchrotron Radiation Diffraction and Transmission Electron Microscopy
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- MRS Online Proceedings Library Archive / Volume 307 / 1993
- Published online by Cambridge University Press:
- 15 February 2011, 299
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- 1993
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