5 results
Aberration-corrected STEM Imaging and EELS Mapping of BaTiO3/SrTiO3 Interfacial Defects
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1598-1599
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- July 2017
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Monolithic integration of perovskites on Ge(001) by atomic layer deposition: a case study with SrHf x Ti1−x O3
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- Journal:
- MRS Communications / Volume 6 / Issue 3 / September 2016
- Published online by Cambridge University Press:
- 14 September 2016, pp. 125-132
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- September 2016
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Recent studies of oxide-semiconductor heterostructures using aberration-corrected scanning transmission electron microscopy
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- Journal:
- Journal of Materials Research / Volume 32 / Issue 5 / 14 March 2017
- Published online by Cambridge University Press:
- 01 August 2016, pp. 912-920
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- 14 March 2017
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Characterization of a ferroelectric BaTiO3/SrTiO3heterostructure with interface-induced polarization
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1508-1509
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- July 2016
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Cross-Sectional Characterization of SrTiO3/Si(001) Interfaces using Aberration-Corrected STEM
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1305-1306
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- August 2015
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