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Microscopy and Microanalysis Microscopy and Microanalysis

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Aberration-corrected STEM Imaging and EELS Mapping of BaTiO3/SrTiO3 Interfacial Defects

Published online by Cambridge University Press:  04 August 2017

HsinWei Wu ,
Sirong Lu ,
Patrick Ponath ,
Toshihiro Aoki ,
John G. Ekerdt ,
Alexander A. Demkov ,
Martha R. McCartney  and
David J. Smith
HsinWei Wu
Affiliation:
School of Engineering for Matter, Transport and Energy, Arizona State University, Tempe, AZ
Sirong Lu
Affiliation:
School of Engineering for Matter, Transport and Energy, Arizona State University, Tempe, AZ
Patrick Ponath
Affiliation:
Department of Physics, University of Texas at Austin, Austin, TX
Toshihiro Aoki
Affiliation:
LeRoy Eyring Center for Solid State Science, Arizona State University, Tempe AZ
John G. Ekerdt
Affiliation:
Department of Chemical Engineering, University of Texas at Austin, Austin, TX
Alexander A. Demkov
Affiliation:
Department of Physics, University of Texas at Austin, Austin, TX
Martha R. McCartney
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ
David J. Smith
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ
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Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1598 - 1599
Copyright
© Microscopy Society of America 2017 

References

[1] This work was supported by AFOSR Contract FA 9550-14-0090. We gratefully acknowledge the use of facilities within the John M. Cowley Center for HREM at Arizona State University.Google Scholar
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Aberration-corrected STEM Imaging and EELS Mapping of BaTiO3/SrTiO3 Interfacial Defects
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